Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability
Summary :
An elastic-Vt CMOS circuit is proposed which facilitates both high speed and low power consumption at low supply voltages. This circuit permits fine-grain power control on each multiple circuit block composing a chip, and it is not sensitive to design factors as device-parameter deviations or operating-environment variations. It also does not require any such additional fabrication technology as triple-well structure or multi-threshold voltage. The effectiveness of the circuit
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E81-C No.9 pp.1463-1472
- Publication Date
- 1998/09/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
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Masayuki MIZUNO, Hitoshi ABIKO, Koichiro FURUTA, Isami SAKAI, Masakazu YAMASHINA, "Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 9, pp. 1463-1472, September 1998, doi: .
Abstract: An elastic-Vt CMOS circuit is proposed which facilitates both high speed and low power consumption at low supply voltages. This circuit permits fine-grain power control on each multiple circuit block composing a chip, and it is not sensitive to design factors as device-parameter deviations or operating-environment variations. It also does not require any such additional fabrication technology as triple-well structure or multi-threshold voltage. The effectiveness of the circuit
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_9_1463/_p
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@ARTICLE{e81-c_9_1463,
author={Masayuki MIZUNO, Hitoshi ABIKO, Koichiro FURUTA, Isami SAKAI, Masakazu YAMASHINA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability},
year={1998},
volume={E81-C},
number={9},
pages={1463-1472},
abstract={An elastic-Vt CMOS circuit is proposed which facilitates both high speed and low power consumption at low supply voltages. This circuit permits fine-grain power control on each multiple circuit block composing a chip, and it is not sensitive to design factors as device-parameter deviations or operating-environment variations. It also does not require any such additional fabrication technology as triple-well structure or multi-threshold voltage. The effectiveness of the circuit
keywords={},
doi={},
ISSN={},
month={September},}
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TY - JOUR
TI - Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability
T2 - IEICE TRANSACTIONS on Electronics
SP - 1463
EP - 1472
AU - Masayuki MIZUNO
AU - Hitoshi ABIKO
AU - Koichiro FURUTA
AU - Isami SAKAI
AU - Masakazu YAMASHINA
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 1998
AB - An elastic-Vt CMOS circuit is proposed which facilitates both high speed and low power consumption at low supply voltages. This circuit permits fine-grain power control on each multiple circuit block composing a chip, and it is not sensitive to design factors as device-parameter deviations or operating-environment variations. It also does not require any such additional fabrication technology as triple-well structure or multi-threshold voltage. The effectiveness of the circuit
ER -
English
