Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification
Summary :
Gate-to-bulk overlap capacitance (CGBO) cannot be ignored for long gate channel MOSFET's that are used for various I/O and analog circuits. We present a simple and yet accurate CGBO measurement and extractions by using a group of MOSFET's. Dedicated test structures using 0.18 µm shallow trench isolation technology were fabricated for the purpose. The effect of CGBO has been successfully analyzed. Validity of the CGBO extraction has been verified by comparing measured time delay of 51 stage ring oscillators with simulated data using our customized UCB SPICE3 simulator.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E87-C No.6 pp.929-932
- Publication Date
- 2004/06/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
- Category
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Masanori SHIMASUE, Yasuo KAWAHARA, Takeshi SANO, Hitoshi AOKI, "Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification" in IEICE TRANSACTIONS on Electronics,
vol. E87-C, no. 6, pp. 929-932, June 2004, doi: .
Abstract: Gate-to-bulk overlap capacitance (CGBO) cannot be ignored for long gate channel MOSFET's that are used for various I/O and analog circuits. We present a simple and yet accurate CGBO measurement and extractions by using a group of MOSFET's. Dedicated test structures using 0.18 µm shallow trench isolation technology were fabricated for the purpose. The effect of CGBO has been successfully analyzed. Validity of the CGBO extraction has been verified by comparing measured time delay of 51 stage ring oscillators with simulated data using our customized UCB SPICE3 simulator.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e87-c_6_929/_p
Copy
@ARTICLE{e87-c_6_929,
author={Masanori SHIMASUE, Yasuo KAWAHARA, Takeshi SANO, Hitoshi AOKI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification},
year={2004},
volume={E87-C},
number={6},
pages={929-932},
abstract={Gate-to-bulk overlap capacitance (CGBO) cannot be ignored for long gate channel MOSFET's that are used for various I/O and analog circuits. We present a simple and yet accurate CGBO measurement and extractions by using a group of MOSFET's. Dedicated test structures using 0.18 µm shallow trench isolation technology were fabricated for the purpose. The effect of CGBO has been successfully analyzed. Validity of the CGBO extraction has been verified by comparing measured time delay of 51 stage ring oscillators with simulated data using our customized UCB SPICE3 simulator.},
keywords={},
doi={},
ISSN={},
month={June},}
Copy
TY - JOUR
TI - Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification
T2 - IEICE TRANSACTIONS on Electronics
SP - 929
EP - 932
AU - Masanori SHIMASUE
AU - Yasuo KAWAHARA
AU - Takeshi SANO
AU - Hitoshi AOKI
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E87-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2004
AB - Gate-to-bulk overlap capacitance (CGBO) cannot be ignored for long gate channel MOSFET's that are used for various I/O and analog circuits. We present a simple and yet accurate CGBO measurement and extractions by using a group of MOSFET's. Dedicated test structures using 0.18 µm shallow trench isolation technology were fabricated for the purpose. The effect of CGBO has been successfully analyzed. Validity of the CGBO extraction has been verified by comparing measured time delay of 51 stage ring oscillators with simulated data using our customized UCB SPICE3 simulator.
ER -
English
