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Evaluation of a True Random Number Generator Utilizing Timing Jitters in RSFQ Logic Circuits
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Summary :
We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E105-C No.6 pp.296-299
- Publication Date
- 2022/06/01
- Publicized
- 2022/01/19
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.2021SES0001
- Type of Manuscript
- BRIEF PAPER
- Category
Authors
Kenta SATO
The University of Electro-Communications
Naonori SEGA
The University of Electro-Communications
Yuta SOMEI
The University of Electro-Communications
Hiroshi SHIMADA
The University of Electro-Communications
Takeshi ONOMI
Fukuoka Institute of Technology
Yoshinao MIZUGAKI
The University of Electro-Communications
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Kenta SATO, Naonori SEGA, Yuta SOMEI, Hiroshi SHIMADA, Takeshi ONOMI, Yoshinao MIZUGAKI, "Evaluation of a True Random Number Generator Utilizing Timing Jitters in RSFQ Logic Circuits" in IEICE TRANSACTIONS on Electronics,
vol. E105-C, no. 6, pp. 296-299, June 2022, doi: 10.1587/transele.2021SES0001.
Abstract: We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.2021SES0001/_p
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@ARTICLE{e105-c_6_296,
author={Kenta SATO, Naonori SEGA, Yuta SOMEI, Hiroshi SHIMADA, Takeshi ONOMI, Yoshinao MIZUGAKI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Evaluation of a True Random Number Generator Utilizing Timing Jitters in RSFQ Logic Circuits},
year={2022},
volume={E105-C},
number={6},
pages={296-299},
abstract={We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.},
keywords={},
doi={10.1587/transele.2021SES0001},
ISSN={1745-1353},
month={June},}
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TY - JOUR
TI - Evaluation of a True Random Number Generator Utilizing Timing Jitters in RSFQ Logic Circuits
T2 - IEICE TRANSACTIONS on Electronics
SP - 296
EP - 299
AU - Kenta SATO
AU - Naonori SEGA
AU - Yuta SOMEI
AU - Hiroshi SHIMADA
AU - Takeshi ONOMI
AU - Yoshinao MIZUGAKI
PY - 2022
DO - 10.1587/transele.2021SES0001
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E105-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2022
AB - We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.
ER -
English
