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IEICE TRANSACTIONS on Electronics

Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs

Takayuki MORI, Jiro IDA, Shota INOUE, Takahiro YOSHIDA

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Summary :

We report the characterization of hysteresis in SOI-based super-steep subthreshold slope FETs, which are conventional floating body and body-tied, and newly proposed PN-body-tied structures. We found that the hysteresis widths of the PN-body-tied structures are smaller than that of the conventional floating body and body-tied structures; this means that they are feasible for switching devices. Detailed characterizations of the hysteresis widths of each device are also reported in the study, such as dependency on the gate length and the impurity concentration.

Publication
IEICE TRANSACTIONS on Electronics Vol.E101-C No.5 pp.334-337
Publication Date
2018/05/01
Publicized
Online ISSN
1745-1353
DOI
10.1587/transele.E101.C.334
Type of Manuscript
BRIEF PAPER
Category

Authors

Takayuki MORI
  Kanazawa Institute of Technology
Jiro IDA
  Kanazawa Institute of Technology
Shota INOUE
  Kanazawa Institute of Technology
Takahiro YOSHIDA
  Kanazawa Institute of Technology

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