A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method
Summary :
Minimizing the residual impurity gases is a key factor for reducing temporal dark image sticking. Therefore, this paper uses a vacuum-sealing method that minimizes the residual impurity gases by enhancing the base vacuum level, and the resultant change in temporal dark image sticking is then examined in comparison to that with the conventional sealing method using 42-in. ac-PDPs with a high Xe (11%) content. As a result of monitoring the difference in the display luminance, infrared emission, and perceived luminance between the cells with and without temporal dark image sticking, the vacuum-sealing method is demonstrated to reduce temporal dark image sticking by decreasing the residual impurity gases and increasing the oxygen vacancy in the MgO layer. Furthermore, the use of a modified driving waveform along with the vacuum-sealing method is even more effective in reducing temporal dark image sticking.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E92-C No.1 pp.161-165
- Publication Date
- 2009/01/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E92.C.161
- Type of Manuscript
- PAPER
- Category
- Electronic Displays
Authors
Keyword
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Choon-Sang PARK, Heung-Sik TAE, "A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method" in IEICE TRANSACTIONS on Electronics,
vol. E92-C, no. 1, pp. 161-165, January 2009, doi: 10.1587/transele.E92.C.161.
Abstract: Minimizing the residual impurity gases is a key factor for reducing temporal dark image sticking. Therefore, this paper uses a vacuum-sealing method that minimizes the residual impurity gases by enhancing the base vacuum level, and the resultant change in temporal dark image sticking is then examined in comparison to that with the conventional sealing method using 42-in. ac-PDPs with a high Xe (11%) content. As a result of monitoring the difference in the display luminance, infrared emission, and perceived luminance between the cells with and without temporal dark image sticking, the vacuum-sealing method is demonstrated to reduce temporal dark image sticking by decreasing the residual impurity gases and increasing the oxygen vacancy in the MgO layer. Furthermore, the use of a modified driving waveform along with the vacuum-sealing method is even more effective in reducing temporal dark image sticking.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E92.C.161/_p
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@ARTICLE{e92-c_1_161,
author={Choon-Sang PARK, Heung-Sik TAE, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method},
year={2009},
volume={E92-C},
number={1},
pages={161-165},
abstract={Minimizing the residual impurity gases is a key factor for reducing temporal dark image sticking. Therefore, this paper uses a vacuum-sealing method that minimizes the residual impurity gases by enhancing the base vacuum level, and the resultant change in temporal dark image sticking is then examined in comparison to that with the conventional sealing method using 42-in. ac-PDPs with a high Xe (11%) content. As a result of monitoring the difference in the display luminance, infrared emission, and perceived luminance between the cells with and without temporal dark image sticking, the vacuum-sealing method is demonstrated to reduce temporal dark image sticking by decreasing the residual impurity gases and increasing the oxygen vacancy in the MgO layer. Furthermore, the use of a modified driving waveform along with the vacuum-sealing method is even more effective in reducing temporal dark image sticking.},
keywords={},
doi={10.1587/transele.E92.C.161},
ISSN={1745-1353},
month={January},}
Copy
TY - JOUR
TI - A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method
T2 - IEICE TRANSACTIONS on Electronics
SP - 161
EP - 165
AU - Choon-Sang PARK
AU - Heung-Sik TAE
PY - 2009
DO - 10.1587/transele.E92.C.161
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E92-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2009
AB - Minimizing the residual impurity gases is a key factor for reducing temporal dark image sticking. Therefore, this paper uses a vacuum-sealing method that minimizes the residual impurity gases by enhancing the base vacuum level, and the resultant change in temporal dark image sticking is then examined in comparison to that with the conventional sealing method using 42-in. ac-PDPs with a high Xe (11%) content. As a result of monitoring the difference in the display luminance, infrared emission, and perceived luminance between the cells with and without temporal dark image sticking, the vacuum-sealing method is demonstrated to reduce temporal dark image sticking by decreasing the residual impurity gases and increasing the oxygen vacancy in the MgO layer. Furthermore, the use of a modified driving waveform along with the vacuum-sealing method is even more effective in reducing temporal dark image sticking.
ER -
English
