The search functionality is under construction.

IEICE TRANSACTIONS on Electronics

Delay Time Component of InGaAs MOSFET Caused by Dynamic Source Resistance

Masayuki YAMADA, Ken UCHIDA, Yasuyuki MIYAMOTO

  • Full Text Views

    0

  • Cite this

Summary :

The delay time component (τs) of an InGaAs MOSFET caused by dynamic source resistance is discussed. On the basis of the relationship between the current density (J) and the dynamic source resistance (rs), the value of rs is proportional to 1/J with some offset at low current densities, whereas the offset becomes smaller in a region of high current density. The value of τs depends on the current in a way similar to rs. Because the offset in the high-current-density region is proportional to the square root of the effective mass, an InGaAs MOSFET with a small mass has a shorter rs than a Si MOSFET.

Publication
IEICE TRANSACTIONS on Electronics Vol.E97-C No.5 pp.419-422
Publication Date
2014/05/01
Publicized
Online ISSN
1745-1353
DOI
10.1587/transele.E97.C.419
Type of Manuscript
BRIEF PAPER
Category

Authors

Masayuki YAMADA
  Tokyo Institute of Technology
Ken UCHIDA
  Keio University
Yasuyuki MIYAMOTO
  Tokyo Institute of Technology

Keyword