Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.
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Atsushi KUROKAWA, Hiroshi FUJITA, Tetsuya IBE, "Prevention in a Chip of EMI Noise Caused by X'tal Oscillator" in IEICE TRANSACTIONS on Fundamentals,
vol. E91-A, no. 4, pp. 1077-1083, April 2008, doi: 10.1093/ietfec/e91-a.4.1077.
Abstract: Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e91-a.4.1077/_p
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@ARTICLE{e91-a_4_1077,
author={Atsushi KUROKAWA, Hiroshi FUJITA, Tetsuya IBE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Prevention in a Chip of EMI Noise Caused by X'tal Oscillator},
year={2008},
volume={E91-A},
number={4},
pages={1077-1083},
abstract={Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.},
keywords={},
doi={10.1093/ietfec/e91-a.4.1077},
ISSN={1745-1337},
month={April},}
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TY - JOUR
TI - Prevention in a Chip of EMI Noise Caused by X'tal Oscillator
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1077
EP - 1083
AU - Atsushi KUROKAWA
AU - Hiroshi FUJITA
AU - Tetsuya IBE
PY - 2008
DO - 10.1093/ietfec/e91-a.4.1077
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E91-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2008
AB - Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.
ER -