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A Fault Model for Multiple-Valued PLA's and Its Equivalences

Yasunori NAGATA, Masao MUKAIDONO

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Summary :

In this paper, a fault model for multiple-valued programmable logic arrays (MV-PLAs) is proposed and the equivalences of faults of MV-PLA's are discussed. In a supposed multiple-valued NOR/TSUM PLA model, it is shown that multiple-valued stuck-at faults, multiple-valued bridging faults, multiple-valued threshold shift faults and other some faults in a literal generator circuit are equivalent or subequivalent to a multiple crosspoint fault in the NOR plane or a multiple fault of weights in the TSUM plane. These results lead the fact that multiple-valued test vector set which indicates all multiple crosspoint fault and all multiple fault of weights also detects above equivalent or subequivalent faults in a MV-PLA.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E77-A No.9 pp.1527-1534
Publication Date
1994/09/25
Publicized
Online ISSN
DOI
Type of Manuscript
PAPER
Category
Computer Aided Design (CAD)

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