IEICE TRANSACTIONS on Fundamentals
Substrate Noise Simulation Techniques for Analog-Digital Mixed LSI Design
Summary :
Crosstalk from digital to analog circuits can be causative of operation fails in analog-digital mixed LSIs. This paper describes modeling techniques and simulation strategies of the substrate coupling noise. A macroscopic substrate noise model that expresses the noise as a function of logic state transition frequencies among digital blocks is proposed. A simulation system based on the model is implemented in the mixed signal simulation environment, where performance degradation of the 2nd order ΔΣADC coupled to digital noise sources is clearly simulated. These results indicate that the proposed behavioral modeling approach allows practicable full chip substrate noise simulation measures.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E82-A No.2 pp.271-278
- Publication Date
- 1999/02/25
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section INVITED PAPER (Special Section on Analog Circuit Techniques and Related Topics)
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Makoto NAGATA, Atsushi IWATA, "Substrate Noise Simulation Techniques for Analog-Digital Mixed LSI Design" in IEICE TRANSACTIONS on Fundamentals,
vol. E82-A, no. 2, pp. 271-278, February 1999, doi: .
Abstract: Crosstalk from digital to analog circuits can be causative of operation fails in analog-digital mixed LSIs. This paper describes modeling techniques and simulation strategies of the substrate coupling noise. A macroscopic substrate noise model that expresses the noise as a function of logic state transition frequencies among digital blocks is proposed. A simulation system based on the model is implemented in the mixed signal simulation environment, where performance degradation of the 2nd order ΔΣADC coupled to digital noise sources is clearly simulated. These results indicate that the proposed behavioral modeling approach allows practicable full chip substrate noise simulation measures.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e82-a_2_271/_p
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@ARTICLE{e82-a_2_271,
author={Makoto NAGATA, Atsushi IWATA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Substrate Noise Simulation Techniques for Analog-Digital Mixed LSI Design},
year={1999},
volume={E82-A},
number={2},
pages={271-278},
abstract={Crosstalk from digital to analog circuits can be causative of operation fails in analog-digital mixed LSIs. This paper describes modeling techniques and simulation strategies of the substrate coupling noise. A macroscopic substrate noise model that expresses the noise as a function of logic state transition frequencies among digital blocks is proposed. A simulation system based on the model is implemented in the mixed signal simulation environment, where performance degradation of the 2nd order ΔΣADC coupled to digital noise sources is clearly simulated. These results indicate that the proposed behavioral modeling approach allows practicable full chip substrate noise simulation measures.},
keywords={},
doi={},
ISSN={},
month={February},}
Copy
TY - JOUR
TI - Substrate Noise Simulation Techniques for Analog-Digital Mixed LSI Design
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 271
EP - 278
AU - Makoto NAGATA
AU - Atsushi IWATA
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E82-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 1999
AB - Crosstalk from digital to analog circuits can be causative of operation fails in analog-digital mixed LSIs. This paper describes modeling techniques and simulation strategies of the substrate coupling noise. A macroscopic substrate noise model that expresses the noise as a function of logic state transition frequencies among digital blocks is proposed. A simulation system based on the model is implemented in the mixed signal simulation environment, where performance degradation of the 2nd order ΔΣADC coupled to digital noise sources is clearly simulated. These results indicate that the proposed behavioral modeling approach allows practicable full chip substrate noise simulation measures.
ER -
English
