In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.
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Mu-Shun Matt LEE, Chien-Nan Jimmy LIU, "Dynamic Supply Current Waveform Estimation with Standard Library Information" in IEICE TRANSACTIONS on Fundamentals,
vol. E93-A, no. 3, pp. 595-606, March 2010, doi: 10.1587/transfun.E93.A.595.
Abstract: In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E93.A.595/_p
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@ARTICLE{e93-a_3_595,
author={Mu-Shun Matt LEE, Chien-Nan Jimmy LIU, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Dynamic Supply Current Waveform Estimation with Standard Library Information},
year={2010},
volume={E93-A},
number={3},
pages={595-606},
abstract={In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.},
keywords={},
doi={10.1587/transfun.E93.A.595},
ISSN={1745-1337},
month={March},}
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TY - JOUR
TI - Dynamic Supply Current Waveform Estimation with Standard Library Information
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 595
EP - 606
AU - Mu-Shun Matt LEE
AU - Chien-Nan Jimmy LIU
PY - 2010
DO - 10.1587/transfun.E93.A.595
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E93-A
IS - 3
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - March 2010
AB - In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.
ER -