We present a time-to-digital converter (TDC) achieving sub-picosecond resolution and high precision for all-digital phase-locked-loops (ADPLLs). The basic idea is using a charge pump to translate time interval into charge, and a successive-approximation-register-analog-to-digital converter (SAR-ADC) to quantize the charge. With this less complex configuration, high resolution, high precision, low power, and small area can be achieved all together. We analyzed the noise contribution from the charge pump and describe detailed design and implementation for sizing the capacitor and transistors, with the awareness of noise and linearity. The analysis demonstrates the proposed TDC capable of sub-picosecond resolution and high precision. Two prototype chips were fabricated in 65nm CMOS with 0.06mm2, and 0.018mm2 core areas, respectively. The achieved resolutions are 0.84ps and 0.80ps, in 8-bit and 10-bit range, respectively. The measured single-shot-precisions range from 0.22 to 0.6ps, and from 0.66 to 1.04ps, respectively, showing consistent trends with the analysis. Compared with state-of-the-arts, best performance balance has been achieved.
Zule XU
Tokyo Institute of Technology
Seungjong LEE
Tokyo Institute of Technology
Masaya MIYAHARA
Tokyo Institute of Technology
Akira MATSUZAWA
Tokyo Institute of Technology
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Zule XU, Seungjong LEE, Masaya MIYAHARA, Akira MATSUZAWA, "Sub-Picosecond Resolution and High-Precision TDC for ADPLLs Using Charge Pump and SAR-ADC" in IEICE TRANSACTIONS on Fundamentals,
vol. E98-A, no. 2, pp. 476-484, February 2015, doi: 10.1587/transfun.E98.A.476.
Abstract: We present a time-to-digital converter (TDC) achieving sub-picosecond resolution and high precision for all-digital phase-locked-loops (ADPLLs). The basic idea is using a charge pump to translate time interval into charge, and a successive-approximation-register-analog-to-digital converter (SAR-ADC) to quantize the charge. With this less complex configuration, high resolution, high precision, low power, and small area can be achieved all together. We analyzed the noise contribution from the charge pump and describe detailed design and implementation for sizing the capacitor and transistors, with the awareness of noise and linearity. The analysis demonstrates the proposed TDC capable of sub-picosecond resolution and high precision. Two prototype chips were fabricated in 65nm CMOS with 0.06mm2, and 0.018mm2 core areas, respectively. The achieved resolutions are 0.84ps and 0.80ps, in 8-bit and 10-bit range, respectively. The measured single-shot-precisions range from 0.22 to 0.6ps, and from 0.66 to 1.04ps, respectively, showing consistent trends with the analysis. Compared with state-of-the-arts, best performance balance has been achieved.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E98.A.476/_p
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@ARTICLE{e98-a_2_476,
author={Zule XU, Seungjong LEE, Masaya MIYAHARA, Akira MATSUZAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Sub-Picosecond Resolution and High-Precision TDC for ADPLLs Using Charge Pump and SAR-ADC},
year={2015},
volume={E98-A},
number={2},
pages={476-484},
abstract={We present a time-to-digital converter (TDC) achieving sub-picosecond resolution and high precision for all-digital phase-locked-loops (ADPLLs). The basic idea is using a charge pump to translate time interval into charge, and a successive-approximation-register-analog-to-digital converter (SAR-ADC) to quantize the charge. With this less complex configuration, high resolution, high precision, low power, and small area can be achieved all together. We analyzed the noise contribution from the charge pump and describe detailed design and implementation for sizing the capacitor and transistors, with the awareness of noise and linearity. The analysis demonstrates the proposed TDC capable of sub-picosecond resolution and high precision. Two prototype chips were fabricated in 65nm CMOS with 0.06mm2, and 0.018mm2 core areas, respectively. The achieved resolutions are 0.84ps and 0.80ps, in 8-bit and 10-bit range, respectively. The measured single-shot-precisions range from 0.22 to 0.6ps, and from 0.66 to 1.04ps, respectively, showing consistent trends with the analysis. Compared with state-of-the-arts, best performance balance has been achieved.},
keywords={},
doi={10.1587/transfun.E98.A.476},
ISSN={1745-1337},
month={February},}
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TY - JOUR
TI - Sub-Picosecond Resolution and High-Precision TDC for ADPLLs Using Charge Pump and SAR-ADC
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 476
EP - 484
AU - Zule XU
AU - Seungjong LEE
AU - Masaya MIYAHARA
AU - Akira MATSUZAWA
PY - 2015
DO - 10.1587/transfun.E98.A.476
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E98-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 2015
AB - We present a time-to-digital converter (TDC) achieving sub-picosecond resolution and high precision for all-digital phase-locked-loops (ADPLLs). The basic idea is using a charge pump to translate time interval into charge, and a successive-approximation-register-analog-to-digital converter (SAR-ADC) to quantize the charge. With this less complex configuration, high resolution, high precision, low power, and small area can be achieved all together. We analyzed the noise contribution from the charge pump and describe detailed design and implementation for sizing the capacitor and transistors, with the awareness of noise and linearity. The analysis demonstrates the proposed TDC capable of sub-picosecond resolution and high precision. Two prototype chips were fabricated in 65nm CMOS with 0.06mm2, and 0.018mm2 core areas, respectively. The achieved resolutions are 0.84ps and 0.80ps, in 8-bit and 10-bit range, respectively. The measured single-shot-precisions range from 0.22 to 0.6ps, and from 0.66 to 1.04ps, respectively, showing consistent trends with the analysis. Compared with state-of-the-arts, best performance balance has been achieved.
ER -