On Detection of Bridge Defects with Stuck-at Tests
Summary :
If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.
- Publication
- IEICE TRANSACTIONS on Information Vol.E91-D No.3 pp.683-689
- Publication Date
- 2008/03/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e91-d.3.683
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSIs)
- Category
- Defect-Based Testing
Authors
Keyword
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Kohei MIYASE, Kenta TERASHIMA, Xiaoqing WEN, Seiji KAJIHARA, Sudhakar M. REDDY, "On Detection of Bridge Defects with Stuck-at Tests" in IEICE TRANSACTIONS on Information,
vol. E91-D, no. 3, pp. 683-689, March 2008, doi: 10.1093/ietisy/e91-d.3.683.
Abstract: If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e91-d.3.683/_p
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@ARTICLE{e91-d_3_683,
author={Kohei MIYASE, Kenta TERASHIMA, Xiaoqing WEN, Seiji KAJIHARA, Sudhakar M. REDDY, },
journal={IEICE TRANSACTIONS on Information},
title={On Detection of Bridge Defects with Stuck-at Tests},
year={2008},
volume={E91-D},
number={3},
pages={683-689},
abstract={If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.},
keywords={},
doi={10.1093/ietisy/e91-d.3.683},
ISSN={1745-1361},
month={March},}
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TY - JOUR
TI - On Detection of Bridge Defects with Stuck-at Tests
T2 - IEICE TRANSACTIONS on Information
SP - 683
EP - 689
AU - Kohei MIYASE
AU - Kenta TERASHIMA
AU - Xiaoqing WEN
AU - Seiji KAJIHARA
AU - Sudhakar M. REDDY
PY - 2008
DO - 10.1093/ietisy/e91-d.3.683
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E91-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2008
AB - If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.
ER -
English
