Testing of <I>k</I>-FR Circuits under Highly Observable Condition

Xiaoqing WEN; Hideo TAMAMOTO; Kozo KINOSHITA

Testing of k-FR Circuits under Highly Observable Condition

Xiaoqing WEN, Hideo TAMAMOTO, Kozo KINOSHITA

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This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.

Publication: IEICE TRANSACTIONS on Information Vol.E78-D No.7 pp.830-838

Publication Date: 1995/07/25

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Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)

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Xiaoqing WEN, Hideo TAMAMOTO, Kozo KINOSHITA, "Testing of k-FR Circuits under Highly Observable Condition" in IEICE TRANSACTIONS on Information, vol. E78-D, no. 7, pp. 830-838, July 1995, doi: .
Abstract: This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.
URL: https://global.ieice.org/en_transactions/information/10.1587/e78-d_7_830/_p

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@ARTICLE{e78-d_7_830,
author={Xiaoqing WEN, Hideo TAMAMOTO, Kozo KINOSHITA, },
journal={IEICE TRANSACTIONS on Information},
title={Testing of k-FR Circuits under Highly Observable Condition},
year={1995},
volume={E78-D},
number={7},
pages={830-838},
abstract={This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.},
keywords={},
doi={},
ISSN={},
month={July},}

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TY - JOUR
TI - Testing of k-FR Circuits under Highly Observable Condition
T2 - IEICE TRANSACTIONS on Information
SP - 830
EP - 838
AU - Xiaoqing WEN
AU - Hideo TAMAMOTO
AU - Kozo KINOSHITA
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E78-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 1995
AB - This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.
ER -