This paper proposes a power supply voltage control technique, and demonstrates its effectiveness for eliminating the overkills and underkills due to the power supply characteristic difference between an automatic test equipment (ATE) and a practical operating environment of the DUT. The proposed method controls the static power supply voltage on the ATE system, so that the ATE can eliminate misjudges for the Pass or Fail of the DUT. The method for calculating the power supply voltage is also described. Experimental results show that the proposed method can eliminate 89% of overkills and underkills in delay fault testing with 105 real silicon devices. Limitations of the proposed method are also discussed.

Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.

This paper proposes a scan design for delay fault testability of dual circuits. In normal operation mode, each proposed scan flip flop operates as a master-slave flip flop. In test mode, the proposed scan design performs scan operation using two scan paths, namely master scan path and slave scan path. The master scan path consists of master latches and the slave scan path consists of slave latches. In the proposed scan design, arbitrary two-patterns can be set to flip flops of dual circuits. Therefore, it achieves complete fault coverage for robust and non-robust testable delay fault testing. It requires no extra latch unlike enhanced scan design. Thus the area overhead is low. The evaluation shows the test application time of the proposed scan design is 58.0% of that of the enhanced scan design, and the area overhead of the proposed scan design is 13.0% lower than that of the enhanced scan design. In addition, in testing of single circuits, it achieves complete fault coverage of robust and non-robust testable delay fault testing. It requires smaller test data volume than the enhanced scan design in testing of single circuits.

This paper presents a scan design for delay fault testability of 2-rail logic circuits. The flip flops used in the scan design are based on master-slave ones. The proposed scan design provides complete fault coverage in delay fault testing of 2-rail logic circuits. In two-pattern testing with the proposed scan design, initial vectors are set using the set-reset operation, and the scan-in operation for initial vectors is not required. Hence, the test application time is reduced to about half that of the enhanced scan design. Because the additional function is only the set-reset operation of the slave latch, the area overhead is small. The evaluation shows that the differences in the area overhead of the proposed scan design from those of the standard scan design and the enhanced scan design are 2.1 and -14.5 percent on average, respectively.

This paper proposes a method providing efficient test compression. The proposed method is for robust testable path delay fault testing with scan design facilitating two-pattern testing. In the proposed method, test data are interleaved before test compression using statistical coding. This paper also presents test architecture for two-pattern testing using the proposed method. The proposed method is experimentally evaluated from several viewpoints such as compression rates, test application time and area overhead. For robust testable path delay fault testing on 11 out of 20 ISCAS89 benchmark circuits, the proposed method provides better compression rates than the existing methods such as Huffman coding, run-length coding, Golomb coding, frequency-directed run-length (FDR) coding and variable-length input Huffman coding (VIHC).

It has been known that testing of reversible circuits is relatively easier than conventional irreversible circuits in the sense that few test vectors are needed to cover all stuck-at faults. This paper shows, however, that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit using a polynomial time reduction from 3SAT to the problem. We also show non-trivial lower bounds for the size of a minimum complete test set.

There are three well-known approaches to using scan design to apply two-pattern testing: broadside testing (functional justification), skewed-load testing and enhanced scan testing. The broadside and skewed-load testing use the standard scan design, and thus the area overheads are not high. However fault coverage is low. The enhanced scan testing uses the enhanced scan design. The design uses extra latches, and allows scan-in any two-pattern testing. While this method achieves high fault coverage, it causes high area overhead because of extra latches. This paper presents a new scan design where two-pattern testing with high fault coverage can be performed with area overhead as low as the standard scan design. The proposed scan-FFs are based on master-slave FFs. The input of each scan-FF is connected to the output of the master latch and not the slave latch of the previous FF. Every scan-FF maintains the output value during scan-shift operations.

A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the ISCAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.

This paper proposes an efficient methodology of delay fault testing of processor cores using their instruction sets. These test vectors can be applied in the functional mode of operation, hence, self-testing of processor core becomes possible for path delay fault testing. The proposed approach uses a graph theoretic model (represented as an Instruction Execution Graph) of the datapath and a finite state machine model of the controller for the elimination of functionally untestable paths at the early stage without looking into the circuit details and extraction of constraints for the paths that can potentially be tested. Parwan and DLX processors are used to demonstrate the effectiveness of our method.

This paper presents a Quiet-Noisy scan technique for low power delay fault testing. The novel scan cell design provides both the quiet and noisy scan modes. The toggling of scan cell outputs is suppressed in the quiet scan mode so the power is saved. Two-pattern tests are applied in the noisy scan mode so the delay fault testing is possible. The experimental data shows that the Quiet-Noisy scan technique effectively reduces the test power to 56% of that of the regular scan. The transition fault coverage is improved by 19.7% compared to an existing toggle suppression low power technique. The presented technique requires very minimal changes in the existing MUX-scan Design For Testability (DFT) methodology and needs virtually no computation. The penalties are area overhead, speed degradation, and one extra control in test mode.

This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k1)1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.