We introduce a 16 × cascaded time difference amplifier (TDA) using a differential logic delay cell with 0.18 µm CMOS process. By employing the differential logic delay cell in the delay chain instead of the CMOS logic delay cell, less than 8% TD gain offset with 150 ps input range is achieved. The input referred standard deviation of the output time difference error is 2.7 ps and the input referred is improved by 17% compared with that of the previous TDA using the CMOS logic delay cell.

This paper demonstrates the resonant power supply noise reduction effects of STO thin film decoupling capacitors, which are embedded in interposers. The on-interposer STO capacitor consists of SrTiO2 whose dielectric constant is about 20 and is sandwitched by Cu films in an interposer. The on-interposer STO capacitors are directly connected to the LSI PADs so that they provide large decoupling capacitance without package leadframe/bonding wire inductance, resulting in the reduction of the resonant power supply noise. The measured power supply waveforms show significant reduction of the power supply noise, and the Shmoo plots also show the contribution of the STO capacitors to the robust operations of LSIs.

This paper demonstrates a quick start method for Pulse-Width Controlled PLL (PWPLL). Our PLL converts the internal state into digital signals and stores them into a memory before getting into a sleep mode. The wakeup sequence reads the memory and presets the internal state so that our PLL can start the operation with close to the previously locked condition. Since the internal state includes not only the frequency control code but also the phase information, our quick start PLL locks in several clock cycles. A prototype chip fabricated in 0.18µm standard CMOS shows 50ns settling time (4 reference clock cycles), 18.5mW power consumption under 1.8V nominal supply voltage with 105µm×870µm silicon area.

In this paper, we propose a novel gate delay time mismatch tolerant time-mode signal accumulator whose input and output are represented by a time difference of two digital signal transitions. Within the proposed accumulator, the accumulated value is stored as the time difference between the two pulses running around the same ring of a delay line, so that there is no mismatch between the periods of the two pulses, thus the output drift of the accumulator is suppressed in principle without calibrating mismatch of two rings, which is used to store the accumulated value in the conventional one. A prototype of the proposed accumulator was fabricated in 180nm CMOS. The accumulating operation is confirmed by both time and frequency domain experiments. The standard deviation of the error of the accumulating operation is 9.8ps, and compared with the previous work, the peak error over full-scale is reduced by 46% without calibrating the output drift.

This paper proposes a time-to-digital converter (TDC) utilizing the cascaded time difference amplifier (TDA) and shows measurement results with 0.18 µm CMOS. The proposed TDC operates in two modes, a wide input range mode and a fine time resolution mode. We employ a non-linearity calibration technique based on a lookup table. The wide input range mode shows 10.2 ps time resolution over 1.3 ns input range with DNL and INL of +0.8/-0.7LSB and +0.8/-0.4LSB, respectively. The fine time resolution mode shows 1.0 ps time resolution over 60 ps input range with DNL and INL of +0.9/-0.9LSB and +0.8/-1.0LSB, respectively.

This paper proposes a triangular active charge injection method to reduce resonant power supply noise by injecting the adequate amount of charge into the supply line of the LSI in response to the current consumption of the core circuit. The proposed circuit is composed of three key components, a voltage drop detector, an injection controller circuit and a canceling capacitor circuit. In addition to the theoretical analysis of the proposed method, the measurement results indicate that our proposed method with active capacitor can realize about 14% noise reduction compared with the original noise amplitude. The proposed circuit consumes 25.2 mW in steady state and occupies 0.182 mm2.

This paper demonstrates an autonomous di/dt control of power supply for margin aware operation. A di/dt on the power line is detected by a mutual inductor, the induced voltage is multiplied by Gilbert multiplier and the following low pass filter outputs a DC voltage in proportion to the di/dt. The DC voltage is compared with reference voltages, and the modes of the internal circuit is controlled depending on the comparators output. By using this scheme, the di/dt noise power can be autonomously controlled to fall within a defined range set by the reference voltages. Our experimental results show that the internal circuit oscillates between the all-active and the half-active modes, also show that the all/half ratio and the oscillation frequency changes depending on the reference voltages. It proves that our autonomous di/dt noise control scheme works as being designed.

We propose an open source cell library characterizer. Recently, free and open-sourced silicon design communities are attracted by hobby designers, academies and industries. These open-sourced silicon designs are supported by free and open sourced EDAs, however, in our knowledge, tool-chain lacks cell library characterizer to use original standard cells into digital circuit design. This paper proposes an open source cell library characterizer which can generate timing models and power models of standard cell library.

This paper proposes a power supply voltage control technique, and demonstrates its effectiveness for eliminating the overkills and underkills due to the power supply characteristic difference between an automatic test equipment (ATE) and a practical operating environment of the DUT. The proposed method controls the static power supply voltage on the ATE system, so that the ATE can eliminate misjudges for the Pass or Fail of the DUT. The method for calculating the power supply voltage is also described. Experimental results show that the proposed method can eliminate 89% of overkills and underkills in delay fault testing with 105 real silicon devices. Limitations of the proposed method are also discussed.

An optimal design method for a sub-ranging Analog-to-Digital Converter (ADC) based on stochastic comparator is demonstrated by performing theoretical analysis of random comparator offset voltages. If the Cumulative Distribution Function (CDF) of the comparator offset is defined appropriately, we can calculate the PDFs of the output code and the effective resolution of a stochastic comparator. It is possible to model the analog-to-digital conversion accuracy (defined as yield) of a stochastic comparator by assuming that the correlations among the number of comparator offsets within different analog steps corresponding to the Least Significant Bit (LSB) of the output transfer function are negligible. Comparison with Monte Carlo simulation verifies that the proposed model precisely estimates the yield of the ADC when it is designed for a reasonable target yield of >0.8. By applying this model to a stochastic comparator we reveal that an additional calibration significantly enhances the resolution, i.e., it increases the Number of Bits (NOB) by ∼ 2 bits for the same target yield. Extending the model to a stochastic-comparator-based sub-ranging ADC indicates that the ADC design parameters can be tuned to find the optimal resource distribution between the deterministic coarse stage and the stochastic fine stage.

This paper proposes a reference-clock-less quick-start-up CDR that resumes from a stand-by state only with a 4-bit preamble utilizing a phase generator with an embedded Time-to-Digital Converter (TDC). The phase generator detects 1-UI time interval by using its internal TDC and works as a self-tunable digitally-controlled delay line. Once the phase generator coarsely tunes the recovered clock period, then the residual time difference is finely tuned by a fine Digital-to-Time Converter (DTC). Since the tuning resolution of the fine DTC is matched by design with the time resolution of the TDC that is used as a phase detector, the fine tuning completes instantaneously. After the initial coarse and fine delay tuning, the feedback loop for frequency tracking is activated in order to improve Consecutive Identical Digits (CID) tolerance of the CDR. By applying the frequency tracking architecture, the proposed CDR achieves more than 100bits of CID tolerance. A prototype implemented in a 65nm bulk CMOS process operates at a 0.9-2.15Gbps continuous rate. It consumes 5.1-8.4mA in its active state and 42μA leakage current in its stand-by state from a 1.0V supply.

This paper compares a stub and a decoupling capacitor for power supply noise reduction. A quarter-length stub attached to the power supply line of an LSI chip works as a band-eliminate filter, and suppresses the power supply bounce of the designed frequency. The conditions where the stub is more effective than the same-area decoupling capacitor are clarified. The stub will work more efficiently and on-chip integration will be possible on high frequency operation LSIs.

This paper proposes a high frequency resolution Digitally-Controlled Oscillator (DCO) using a single-period control bit switching scheme. The proposed scheme controls the tuning word of DCO in a single period for the fine frequency tuning. The LC type DCO is implemented to realize the proposed scheme, and is fabricated using a standard 65 nm CMOS technology. The measurement results show that the implemented DCO improves the frequency resolution from 560 kHz to 180 kHz without phase noise degradation with an additional area of 200 µm2.

This paper demonstrates an on-chip di/dt detector circuit. The di/dt detector circuit consists of a power supply line, an underlying spiral inductor and an amplifier. The mutual inductor induces a di/dt proportional voltage, and the amplifier amplifies and outputs the value. The measurement results show that the di/dt detector output and the voltage difference between a resistor have good agreement. The di/dt reduction by a decoupling capacitor is also measured using the di/dt detector.

This paper demonstrates a pulse width controlled PLL without using an LPF. A pulse width controlled oscillator accepts the PFD output where its pulse width controls the oscillation frequency. In the pulse width controlled oscillator, the input pulse width is converted into soft thermometer code through a time to soft thermometer code converter and the code controls the ring oscillator frequency. By using this scheme, our PLL realizes LPF-less as well as quantization noise free operation. The prototype chip achieves 60 µm 20 µm layout area using 65 nm CMOS technology along with 1.73 ps rms jitter while consuming 2.81 mW under a 1.2 V supply with 3.125 GHz output frequency.

This paper demonstrates a PLL compiler that generates the final GDSII data from a specification of input and output frequencies with PVT corner conditions. A Pulse Width Controlled PLLs (PWPLL) is composed of digital blocks, and thus suitable for being designed using a standard cell library and being layed out with a commercially available place-and-route (P&R) tool. A PWPLL has 8 design parameters. Our PLL compiler decides the 8 parameters and confirms the PLL operation with the following functions: 1) calculates rough parameter values based on an analytical model, 2) generates SPICE and gate-level verilog netlists with given parameter values, 3) runs SPICE simulations and analyzes the waveform, to examine the oscillation frequency or the voltage of specified nodes at a given time, 4) changes the parameter values to an appropriate direction depending on the waveform analyses to obtain the optimized parameter values, 5) generates scripts that can be used in commercial design tools and invokes the tools with the gate-level verilog netlist to get the final LVS/DRC-verified GDSII data from a P&R and a verification tools, and finally 6) generates the necessary characteristic summary sheets from the post-layout SPICE simulations extracted from the GDSII. Our compiler was applied to an 0.18µm standard CMOS technology to design a PLL with 600MHz output, 600/16MHz input frequency, and confirms the PLL operation with 1.2mW power and 85µm×85µm layout area.

This paper demonstrates a power supply noise reduction using on-board stubs. A quarter-length stub attached to the power supply line of an LSI chip works as a band-eliminate filter, and suppresses the power supply noise of the designed frequency. Preliminary experiments show that 87% of the designed frequency noise component is suppressed when stub patterns are written on a power supply area on a PCB board for a 1.25 GHz operating LSI. The results show the possibility of the stub on-chip integration when the operating frequency of LSIs becomes higher and the stub length becomes shorter.

This paper proposes an on-chip measurement method of PLL through fully digital interface. For the measurement of the PLL transfer function, we modulated the phase of the PLL input in triangular form using Digital-to-Time Converter (DTC) and read out the response by Time-to-Digital Converter (TDC). Combination of the DTC and TDC can obtain the transfer function of the PLL both in the magnitude domain and the phase domain. Since the DTC and TDC can be controlled and observed by digital signals, the measurement can be conducted without any high speed analog signal. Moreover, since the DTC and TDC can be designed symmetrically, the measurement method is robust against Process, Voltage, and Temperature (PVT) variations. At the same time, the employment of the TDC also enables a measurement of the PLL lock range by changing the division ratio of the divider. Two time domain circuits were designed using 180nm CMOS process and the HSPICE simulation results demonstrated the measurement of the transfer function and lock range.

This paper demonstrates a feedforward active substrate noise cancelling technique using a power supply di/dt detector. Since the substrate is usually tied with the ground line with a low impedance, the substrate noise is closely related to the ground bounce which is proportional to the di/dt when inductance is dominant on the ground line impedance. Our active cancelling detects the di/dt of the power supply, and injects an anti-phase current into the substrate so that the di/dt-proportional substrate noise is cancelled out. Our first trial shows that 34% substrate noise reduction is achieved on our test circuit, and the theoretical analysis shows that the optimized canceller design will enhance the substrate noise suppression ratio up to 56%.

This paper presents a decoupling capacitance boosting method for the resonant supply noise reduction by fast voltage hopping of DVS systems. The proposed method utilizes a foot transistor as a switch between a conventional decoupling capacitor (decap) and GND. The switching controls of the foot transistor depending on the supply noise states achieve an effective noise reduction as well as fast settling time compared with the conventional passive decaps. The measurement results of a test chip fabricated in a 0.18 µm CMOS technology show 12X boost of effective decap value, and 65.8% supply noise reduction with 96% settling time improvement.