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Analysis of IDDQ Occurrence in Testing

Arabi KESHK, Yukiya MIURA, Kozo KINOSHITA

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Summary :

This work presents an analysis of IDDQ dependency on the primary current that flows through the bridging fault and driven gates current. A maximum primary current depends only on the test vectors which minimize channel resistances of transistors. The driven gates current generates when intermediate voltage occurs on the faulty node with creation current path between VDD and GND through the driven gates, and its value depends on circuit parameters such as transistor sizes and fan-in number of driven gates.

Publication
IEICE TRANSACTIONS on Information Vol.E84-D No.4 pp.534-536
Publication Date
2001/04/01
Publicized
Online ISSN
DOI
Type of Manuscript
LETTER
Category
Computer System Element

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