Don't Care Identification and Statistical Encoding for Test Data Compression
Summary :
This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.
- Publication
- IEICE TRANSACTIONS on Information Vol.E87-D No.3 pp.544-550
- Publication Date
- 2004/03/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSI)
- Category
- Test Generation and Compaction
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Keyword
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Seiji KAJIHARA, Kenjiro TANIGUCHI, Kohei MIYASE, Irith POMERANZ, Sudhakar M. REDDY, "Don't Care Identification and Statistical Encoding for Test Data Compression" in IEICE TRANSACTIONS on Information,
vol. E87-D, no. 3, pp. 544-550, March 2004, doi: .
Abstract: This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_3_544/_p
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@ARTICLE{e87-d_3_544,
author={Seiji KAJIHARA, Kenjiro TANIGUCHI, Kohei MIYASE, Irith POMERANZ, Sudhakar M. REDDY, },
journal={IEICE TRANSACTIONS on Information},
title={Don't Care Identification and Statistical Encoding for Test Data Compression},
year={2004},
volume={E87-D},
number={3},
pages={544-550},
abstract={This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - Don't Care Identification and Statistical Encoding for Test Data Compression
T2 - IEICE TRANSACTIONS on Information
SP - 544
EP - 550
AU - Seiji KAJIHARA
AU - Kenjiro TANIGUCHI
AU - Kohei MIYASE
AU - Irith POMERANZ
AU - Sudhakar M. REDDY
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2004
AB - This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.
ER -
English
