IEICE TRANSACTIONS on Information
A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation
Summary :
In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the response for a test vector is captured by flip-flops results in excessive voltage drops, known as IR-drops, which may cause significant capture-induced yield loss. In low capture power test generation, the test vectors that violate capture power constraints in an initial test set are defined as capture-unsafe test vectors, while faults that are detected solely by capture-unsafe test vectors are defined as unsafe faults. It is necessary to regenerate the test vectors used to detect unsafe faults in order to prevent unnecessary yield losses. In this paper, we propose a new low capture power test generation method based on fault simulation that uses capture-safe test vectors in an initial test set. Experimental results show that the use of this method reduces the number of unsafe faults by 94% while requiring just 18% more additional test vectors on average, and while requiring less test generation time compared with the conventional low capture power test generation method.
- Publication
- IEICE TRANSACTIONS on Information Vol.E100-D No.9 pp.2118-2125
- Publication Date
- 2017/09/01
- Publicized
- 2017/06/06
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.2016EDP7418
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
Authors
Toshinori HOSOKAWA
Nihon University
Atsushi HIRAI
Nihon University
Yukari YAMAUCHI
Nihon University
Masayuki ARAI
Nihon University
Keyword
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Toshinori HOSOKAWA, Atsushi HIRAI, Yukari YAMAUCHI, Masayuki ARAI, "A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation" in IEICE TRANSACTIONS on Information,
vol. E100-D, no. 9, pp. 2118-2125, September 2017, doi: 10.1587/transinf.2016EDP7418.
Abstract: In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the response for a test vector is captured by flip-flops results in excessive voltage drops, known as IR-drops, which may cause significant capture-induced yield loss. In low capture power test generation, the test vectors that violate capture power constraints in an initial test set are defined as capture-unsafe test vectors, while faults that are detected solely by capture-unsafe test vectors are defined as unsafe faults. It is necessary to regenerate the test vectors used to detect unsafe faults in order to prevent unnecessary yield losses. In this paper, we propose a new low capture power test generation method based on fault simulation that uses capture-safe test vectors in an initial test set. Experimental results show that the use of this method reduces the number of unsafe faults by 94% while requiring just 18% more additional test vectors on average, and while requiring less test generation time compared with the conventional low capture power test generation method.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2016EDP7418/_p
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@ARTICLE{e100-d_9_2118,
author={Toshinori HOSOKAWA, Atsushi HIRAI, Yukari YAMAUCHI, Masayuki ARAI, },
journal={IEICE TRANSACTIONS on Information},
title={A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation},
year={2017},
volume={E100-D},
number={9},
pages={2118-2125},
abstract={In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the response for a test vector is captured by flip-flops results in excessive voltage drops, known as IR-drops, which may cause significant capture-induced yield loss. In low capture power test generation, the test vectors that violate capture power constraints in an initial test set are defined as capture-unsafe test vectors, while faults that are detected solely by capture-unsafe test vectors are defined as unsafe faults. It is necessary to regenerate the test vectors used to detect unsafe faults in order to prevent unnecessary yield losses. In this paper, we propose a new low capture power test generation method based on fault simulation that uses capture-safe test vectors in an initial test set. Experimental results show that the use of this method reduces the number of unsafe faults by 94% while requiring just 18% more additional test vectors on average, and while requiring less test generation time compared with the conventional low capture power test generation method.},
keywords={},
doi={10.1587/transinf.2016EDP7418},
ISSN={1745-1361},
month={September},}
Copy
TY - JOUR
TI - A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation
T2 - IEICE TRANSACTIONS on Information
SP - 2118
EP - 2125
AU - Toshinori HOSOKAWA
AU - Atsushi HIRAI
AU - Yukari YAMAUCHI
AU - Masayuki ARAI
PY - 2017
DO - 10.1587/transinf.2016EDP7418
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E100-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 2017
AB - In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the response for a test vector is captured by flip-flops results in excessive voltage drops, known as IR-drops, which may cause significant capture-induced yield loss. In low capture power test generation, the test vectors that violate capture power constraints in an initial test set are defined as capture-unsafe test vectors, while faults that are detected solely by capture-unsafe test vectors are defined as unsafe faults. It is necessary to regenerate the test vectors used to detect unsafe faults in order to prevent unnecessary yield losses. In this paper, we propose a new low capture power test generation method based on fault simulation that uses capture-safe test vectors in an initial test set. Experimental results show that the use of this method reduces the number of unsafe faults by 94% while requiring just 18% more additional test vectors on average, and while requiring less test generation time compared with the conventional low capture power test generation method.
ER -
English
