IEICE TRANSACTIONS on Information
A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution
Summary :
In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.
- Publication
- IEICE TRANSACTIONS on Information Vol.E96-D No.9 pp.1994-2002
- Publication Date
- 2013/09/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.E96.D.1994
- Type of Manuscript
- Special Section PAPER (Special Section on Dependable Computing)
- Category
Authors
Hiroshi YAMAZAKI
Nihon University
Motohiro WAKAZONO
Nihon University
Toshinori HOSOKAWA
Nihon University
Masayoshi YOSHIMURA
Kyushu University
Keyword
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Hiroshi YAMAZAKI, Motohiro WAKAZONO, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, "A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution" in IEICE TRANSACTIONS on Information,
vol. E96-D, no. 9, pp. 1994-2002, September 2013, doi: 10.1587/transinf.E96.D.1994.
Abstract: In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E96.D.1994/_p
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@ARTICLE{e96-d_9_1994,
author={Hiroshi YAMAZAKI, Motohiro WAKAZONO, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, },
journal={IEICE TRANSACTIONS on Information},
title={A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution},
year={2013},
volume={E96-D},
number={9},
pages={1994-2002},
abstract={In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.},
keywords={},
doi={10.1587/transinf.E96.D.1994},
ISSN={1745-1361},
month={September},}
Copy
TY - JOUR
TI - A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution
T2 - IEICE TRANSACTIONS on Information
SP - 1994
EP - 2002
AU - Hiroshi YAMAZAKI
AU - Motohiro WAKAZONO
AU - Toshinori HOSOKAWA
AU - Masayoshi YOSHIMURA
PY - 2013
DO - 10.1587/transinf.E96.D.1994
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E96-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 2013
AB - In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.
ER -
English
