Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement

Wenpo ZHANG; Kazuteru NAMBA; Hideo ITO

doi:10.1587/transinf.E97.D.533

Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement

Wenpo ZHANG, Kazuteru NAMBA, Hideo ITO

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In recent VLSIs, small-delay defects, which are hard to detect by traditional delay fault testing, can bring about serious issues such as short lifetime. To detect small-delay defects, on-chip delay measurement which measures the delay time of paths in the circuit under test (CUT) was proposed. However, this approach incurs high test cost because it uses scan design, which brings about long test application time due to scan shift operation. Our solution is a test application time reduction method for testing using the on-chip path delay measurement. The testing with on-chip path delay measurement does not require capture operations, unlike the conventional delay testing. Specifically, FFs keep the transition pattern of the test pattern pair sensitizing a path under measurement (PUM) (denoted as p) even after the measurement of p. The proposed method uses this characteristic. The proposed method reduces scan shift time and test data volume using test pattern merging. Evaluation results on ISCAS89 benchmark circuits indicate that the proposed method reduces the test application time by 6.89∼62.67% and test data volume by 46.39∼74.86%.

Publication: IEICE TRANSACTIONS on Information Vol.E97-D No.3 pp.533-540

Publication Date: 2014/03/01

Publicized

Online ISSN: 1745-1361

DOI: 10.1587/transinf.E97.D.533

Type of Manuscript: PAPER

Category: Dependable Computing

Authors

Wenpo ZHANG
  Chiba University
Kazuteru NAMBA
  Chiba University
Hideo ITO
  Chiba University

Keyword

small-delay defects, test compaction, test application time, test data volume, on-chip delay measurement

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Wenpo ZHANG, Kazuteru NAMBA, Hideo ITO, "Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement" in IEICE TRANSACTIONS on Information, vol. E97-D, no. 3, pp. 533-540, March 2014, doi: 10.1587/transinf.E97.D.533.
Abstract: In recent VLSIs, small-delay defects, which are hard to detect by traditional delay fault testing, can bring about serious issues such as short lifetime. To detect small-delay defects, on-chip delay measurement which measures the delay time of paths in the circuit under test (CUT) was proposed. However, this approach incurs high test cost because it uses scan design, which brings about long test application time due to scan shift operation. Our solution is a test application time reduction method for testing using the on-chip path delay measurement. The testing with on-chip path delay measurement does not require capture operations, unlike the conventional delay testing. Specifically, FFs keep the transition pattern of the test pattern pair sensitizing a path under measurement (PUM) (denoted as p) even after the measurement of p. The proposed method uses this characteristic. The proposed method reduces scan shift time and test data volume using test pattern merging. Evaluation results on ISCAS89 benchmark circuits indicate that the proposed method reduces the test application time by 6.89∼62.67% and test data volume by 46.39∼74.86%.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E97.D.533/_p

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@ARTICLE{e97-d_3_533,
author={Wenpo ZHANG, Kazuteru NAMBA, Hideo ITO, },
journal={IEICE TRANSACTIONS on Information},
title={Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement},
year={2014},
volume={E97-D},
number={3},
pages={533-540},
abstract={In recent VLSIs, small-delay defects, which are hard to detect by traditional delay fault testing, can bring about serious issues such as short lifetime. To detect small-delay defects, on-chip delay measurement which measures the delay time of paths in the circuit under test (CUT) was proposed. However, this approach incurs high test cost because it uses scan design, which brings about long test application time due to scan shift operation. Our solution is a test application time reduction method for testing using the on-chip path delay measurement. The testing with on-chip path delay measurement does not require capture operations, unlike the conventional delay testing. Specifically, FFs keep the transition pattern of the test pattern pair sensitizing a path under measurement (PUM) (denoted as p) even after the measurement of p. The proposed method uses this characteristic. The proposed method reduces scan shift time and test data volume using test pattern merging. Evaluation results on ISCAS89 benchmark circuits indicate that the proposed method reduces the test application time by 6.89∼62.67% and test data volume by 46.39∼74.86%.},
keywords={},
doi={10.1587/transinf.E97.D.533},
ISSN={1745-1361},
month={March},}

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TY - JOUR
TI - Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
T2 - IEICE TRANSACTIONS on Information
SP - 533
EP - 540
AU - Wenpo ZHANG
AU - Kazuteru NAMBA
AU - Hideo ITO
PY - 2014
DO - 10.1587/transinf.E97.D.533
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E97-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2014
AB - In recent VLSIs, small-delay defects, which are hard to detect by traditional delay fault testing, can bring about serious issues such as short lifetime. To detect small-delay defects, on-chip delay measurement which measures the delay time of paths in the circuit under test (CUT) was proposed. However, this approach incurs high test cost because it uses scan design, which brings about long test application time due to scan shift operation. Our solution is a test application time reduction method for testing using the on-chip path delay measurement. The testing with on-chip path delay measurement does not require capture operations, unlike the conventional delay testing. Specifically, FFs keep the transition pattern of the test pattern pair sensitizing a path under measurement (PUM) (denoted as p) even after the measurement of p. The proposed method uses this characteristic. The proposed method reduces scan shift time and test data volume using test pattern merging. Evaluation results on ISCAS89 benchmark circuits indicate that the proposed method reduces the test application time by 6.89∼62.67% and test data volume by 46.39∼74.86%.
ER -