Block-based SSTA analyzes the timing variation of a chip caused by process variations effectively. However, block-based SSTA cannot identify critical nodes, nodes that highly influence the timing yield of a chip, used as the effective guidance of timing yield optimization. In this paper, we propose a new timing criticality to identify those nodes, referred to as the timing yield criticality (TYC). The proposed TYC is defined as the change in the timing yield, which is induced by the change in the mean arrival time at a node. For efficiency, we estimate the TYC through linear approximation instead of propagating the changed arrival time at a node to its fanouts. In experiments using the ISCAS 85 benchmark circuits, the proposed method estimated TYCs with the expense of 9.8% of the runtime for the exact computation. The proposed method identified the node that gives the greatest effect on the timing yield in all benchmark circuits, except C6288, while existing methods did not identify that for any circuit. In addition, the proposed method identified 98.4% of the critical nodes in the top 1% in the effect on the timing yield, while existing methods identified only about 10%.

The authors present R2Power, an effective approach to the realizable reduction of RC networks with independent current sources. The proposed approach is based on the entrywise perturbation theory for diagonally dominant M-matrices. The accuracy of the node voltages of the reduced network, as compared to those of the original network, is maintained on the order of the entrywise perturbation performed during reduction. R2Power can be used to reduce the size of RC networks used to model the power networks of SoCs, for efficient IR-drop analysis. Experiments showed that R2Power reduced the size of industrial examples by more than 95%, with maximum relative node voltage errors of less than 0.012%.

In this letter, we propose a new approach to incremental coding of the subfield codes for plasma display panels (PDPs). The proposed approach suppresses the halftone noise of the PDPs, while completely eliminating false contour noise, as do existing incremental subfield codes, by selecting an optimal incremental subfield code adaptively for a given input image. The proposed method maps the problem of selecting the optimal incremental subfield code onto a special-case shortest path problem. Results of experiment using 109 sample images illustrated that the proposed method improved the average peak signal-to-noise ratio by 4.4-6.2 dB in halftone noise compared with existing incremental subfield coding methods.

This letter presents two high-performance level-converting flip-flops (LCFF) for multi-VDD systems, indirect precharging flip-flop (IPFF) and multi-supply complementary pass-transistor flip-flop (MCPFF). Employing a simple precharging scheme, IPFF provides high operating speed. MCPFF, on the other hand, provides low power operations by implementing the edge-triggering function with complementary pass transistors. Performance comparison indicates that IPFF operates at the highest speed and MCPFF consumes the lowest power among the seven LCFFs under evaluation.