Nano-scale VLSI design is facing the problems of increased test data volume. Small delay defects are becoming possible sources of test escapes, and high delay test quality and therefore a greater volume of test data are required. The increased test data volume requires more tester memory and test application time, and both result in test cost inflation. Test pattern ordering gives a practical solution to reduce test cost, where test patterns are ordered so that more defects can be detected as early as possible. In this paper, we propose a test pattern ordering method based on SDQL (Statistical Delay Quality Level), which is a measure of delay test quality considering small delay defects. Our proposed method orders test patterns so that SDQL shrinks fast, which means more delay defects can be detected as early as possible. The proposed method efficiently orders test patterns with minimal usage of time-consuming timing-aware fault simulation. Experimental results demonstrate that our method can obtain test pattern ordering within a reasonable time, and also suggest how to prepare test sets suitable as inputs of test pattern ordering.

Distributed computation has attracted considerable attention and large-scale distributed systems have been designed and developed. A distributed system inherently has possibility of fault tolerance because of its redundancy. Thus, a great deal of investigation has been made to design fault-tolerant distributed algorithms. This paper introduces two promising paradigms, self-stabilization and wait-freedom, for designing fault-tolerant distributed algorithms and discusses some subjects important from the point of view of algorithm engineering.

We present a high-level synthesis scheme that considers weak testability of generated register-transfer level (RTL) data paths, as well as their area and performance. The weak testability, proposed in our previous work, is a testability measure of RTL data paths for non-scan design. In our scheme, we first extract a condition on resource sharing sufficient for weak testability from a data flow graph before synthesis, and treat the condition as design objectives in the following synthesis tasks. We propose heuristic synthesis algorithms which optimize area and the design objectives under the performance constraint.