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[Author] TaeKyu KIM(2hit)

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  • Performance Evaluation of RTLS Based on Active RFID Power Measurement for Dense Moving Objects

    Taekyu KIM  Jin LEE  Seungbeom LEE  Sin-Chong PARK  

     
    LETTER-Sensing

      Vol:
    E92-B No:4
      Page(s):
    1422-1425

    Tracking a large quantity of moving target tags simultaneously is essential for the localization and guidance of people in welfare facilities like hospitals and sanatoriums for the aged. The locating system using active RFID technology consists of a number of fixed RFID readers and tags carried by the target objects, or senior people. We compare the performances of several determination algorithms which use the power measurement of received signals emitted by the moving active RFID tags. This letter presents a study on the effect of collision in tracking large quantities of objects based on active RFID real time location system (RTLS). Traditional trilateration, fingerprinting, and well-known LANDMARC algorithm are evaluated and compared with varying number of moving tags through the SystemC-based computer simulation. From the simulation, we show the tradeoff relationship between the number of moving tags and estimation accuracy.

  • Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology

    Young-Shin HAN  SoYoung KIM  TaeKyu KIM  Jason J. JUNG  

     
    LETTER-Artificial Intelligence, Data Mining

      Vol:
    E93-D No:7
      Page(s):
    2001-2004

    We exploit a structural knowledge representation scheme called System Entity Structure (SES) methodology to represent and manage wafer failure patterns which can make a significant influence to FABs in the semiconductor industry. It is important for the engineers to simulate various system verification processes by using predefined system entities (e.g., decomposition, taxonomy, and coupling relationships of a system) contained in the SES. For better computational performance, given a certain failure pattern, a Pruned SES (PES) can be extracted by selecting the only relevant system entities from the SES. Therefore, the SES-based simulation system allows the engineers to efficiently evaluate and monitor semiconductor data by i) analyzing failures to find out the corresponding causes and ii) managing historical data related to such failures.