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Yohei NAKATA Yuta KIMI Shunsuke OKUMURA Jinwook JUNG Takuya SAWADA Taku TOSHIKAWA Makoto NAGATA Hirofumi NAKANO Makoto YABUUCHI Hidehiro FUJIWARA Koji NII Hiroyuki KAWAI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO
This paper presents a resilient cache memory for dynamic variation tolerance in a 40-nm CMOS. The cache can perform sustained operations under a large-amplitude voltage droop. To realize sustained operation, the resilient cache exploits 7T/14T bit-enhancing SRAM and on-chip voltage/temperature monitoring circuit. 7T/14T bit-enhancing SRAM can reconfigure itself dynamically to a reliable bit-enhancing mode. The on-chip voltage/temperature monitoring circuit can sense a precise supply voltage level of a power rail of the cache. The proposed cache can dynamically change its operation mode using the voltage/temperature monitoring result and can operate reliably under a large-amplitude voltage droop. Experimental result shows that it does not fail with 25% and 30% droop of Vdd and it provides 91 times better failure rate with a 35% droop of Vdd compared with the conventional design.
Jinwook JUNG Yohei NAKATA Shunsuke OKUMURA Hiroshi KAWAGUCHI Masahiko YOSHIMOTO
This paper presents an adaptive cache architecture for wide-range reliable low-voltage operations. The proposed associativity-reconfigurable cache consists of pairs of cache ways so that it can exploit the recovery feature of the novel 7T/14T SRAM cell. Each pair has two operating modes that can be selected based upon the required voltage level of current operating conditions: normal mode for high performance and dependable mode for reliable low-voltage operations. We can obtain reliable low-voltage operations by application of the dependable mode to weaker pairs that cannot operate reliably at low voltages. Meanwhile leaving stronger pairs in the normal mode, we can minimize performance losses. Our chip measurement results show that the proposed cache can trade off its associativity with the minimum operating voltage. Moreover, it can decrease the minimum operating voltage by 140 mV achieving 67.48% and 26.70% reduction of the power dissipation and energy per instruction. Processor simulation results show that designing the on-chip caches using the proposed scheme results in 2.95% maximum IPC losses, but it can be chosen various performance levels. Area estimation results show that the proposed cache adds area overhead of 1.61% and 5.49% in 32-KB and 256-KB caches, respectively.