Full scan design of sequential circuits results in greatly reducing the cost of their test generation. However, it introduces the extra expense of many test clocks to control and observe the values of flip-flops because of the need to shift values for the flip-flops into the scan panh. In this paper we propose a new method of generating compact test sequences for scan-based sequential circuits on the assumption that the number of shift clocks is allowed to vary for each test vector. The method is based on Boolean function manipulation using a shared binary decision diagram (SBDD). Although the test generation algorithm is basically for general sequential circuits, the computational cost is much lower for scan-based sequential circuits than for non-scanbased sequential circuits because the length of a test sequence for each fault is limited. Experimental results show that, for all the tested circuits, test sequences generated by the method require much smaller number of test clocks than compact or minimum test sets for combinational logic part of scan-based sequential circuits. The reduction rate was 48% on the average in the experiments.

In this paper we propose a new timing verification technique named coded time-symbolic simulation, CTSS. Our interest is on simulation of logic circuits consisting of gates whose delay is specified only by its minimum and maximum values. Conventional logic simulation based on min/max delay model leads to over-pessimistic results. In our new method, the cases of possible delay values of each gate are encoded by binary vectors. The circuit behavior for all the possible combinations of the delay values are simulated based on symbolic simulation by assigning Boolean variables to the binary vectors. This simulation technique can deal with logic circuits containing feedback loops as well as combinational circuits. We implemented an efficient simulator by using shared binary decision diagrams (SBDD's) as internal representation of Boolean functions. We also propose novel techniques of analyzing the results of CTSS.