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[Keyword] crosstalk fault(3hit)

1-3hit
  • Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation

    Hiroshi TAKAHASHI  Marong PHADOONGSIDHI  Yoshinobu HIGAMI  Kewal K. SALUJA  Yuzo TAKAMATSU  

     
    PAPER-Test and Diagnosis for Timing Faults

      Vol:
    E85-D No:10
      Page(s):
    1515-1525

    In this paper we propose two diagnosis methods for crosstalk-induced pulse faults in sequential circuits using crosstalk fault simulation. These methods compare observed responses and simulated values at primary outputs to identify a set of suspected faults that are consistent with the observed responses. The first method is a restart-based method which determines the suspected fault list by using the knowledge about the first and last failures of the test sequence. The advantage of the restart-based method over a method using full simulation is its reduction of the number of simulated faults in a process of diagnosing faults. The second method is a resumption-based method which uses stored state information. The advantage of the resumption-based method over the restart-based method is its reduction of the CPU time for diagnosing the faults. The effectiveness of the proposed methods is evaluated by experiments conducted on ISCAS '89 benchmark circuits. From the experimental results we show that the number of suspected faults obtained by our methods is sufficiently small, and the resumption-based method is substantially faster than the restart-based method.

  • Reduction of the Target Fault List and Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino Circuits

    Kazuya SHIMIZU  Takanori SHIRAI  Masaya TAKAMURA  Noriyoshi ITAZAKI  Kozo KINOSHITA  

     
    PAPER-Test and Diagnosis for Timing Faults

      Vol:
    E85-D No:10
      Page(s):
    1526-1533

    In recent years, the domino logic has received much attention as a design technique of high-speed circuits. However, in the case of standard domino logic, only non-inverting functions are allowed. Then, the clock-delayed (CD) domino logic that provides any logic function is proposed in order to overcome such domino's drawback. In addition, domino circuits are more sensitive to circuit noise compared with static CMOS circuits. In particular, crosstalk causes critical problems. Therefore, we focus our attention on crosstalk faults in CD domino circuits. However, in CD domino circuits, there are faults that don't propagate faulty values to any primary output even though crosstalk pulses are generated. Then, we remove such faults from the target fault list by considering structures of CD domino circuits, and perform a fault simulation for the reduced target fault list using two kinds of fault simulation method together. We realize CD domino circuits in VHDL and perform the proposed fault simulation for the combinational part of some benchmark circuits of ISCAS'89 on a VHDL simulator. Fault coverage for random vectors was obtained for s27 to s1494 under the limitation of simulation time.

  • A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits

    Noriyoshi ITAZAKI  Yasutaka IDOMOTO  Kozo KINOSHITA  

     
    PAPER-Testing/Checking

      Vol:
    E80-D No:1
      Page(s):
    38-43

    With the scale-down of VLSI chip size and the reduction of switching time of logic gates, crosstalk faults become an important problem in testing of VLSI. For synchronous sequential circuits, the crosstalk pulses on data lines will be considered to be harmless, because they can be invalidated by a clocking phase. However, crosstalk pulses generated on clock lines or reset lines will cause an erroneous operation. In this work, we have analyzed a crosstalk fault scheme, and developed a fault simulator based on the scheme. Throughout this work, we considered the crosstalk fault as unexpected strong capacitive coupling between one data line and one clock line. Since we must consider timing in addition to a logic value, the unit delay model is used in our fault simulation. Our experiments on some benchmark circuits show that fault activation rates and fault detection rates vary widely depending on circuit characteristics. Fault detection rates of up to 80% are obtained from our simulation with test vectors generated at random.