This work presents the thermal noise analysis results of ring amplifiers in the MDAC of cyclic ADC. Ring amplifier is an alternative closed-loop structure for residual signal amplification with MDAC, and two types of ring amplifiers: pseudo-differential and fully-differential ring-amplifiers are considered for the implementation of MDAC in cyclic ADC. Theoretical analysis results show that power of thermal noise in MDAC with a pseudo-differential amplifier is much higher than that with a fully-differential ring-amplifier. SPICE simulation results with transient noise analyses also show the similar trend. Experimental prototype cyclic ADCs in 65nm CMOS technology are implemented with the same architecture and the same circuit components except for amplifiers. Comparison of the measured results of the two ADCs confirms the validity of the theoretical analysis results.

This paper reviews architectures and topologies for column-parallel analog-to-digital converters (ADCs) used for CMOS image sensors (CISs) and discusses the performance of CISs using column-parallel ADCs based on figures-of-merit (FoM) with considering noise models which behave differently at low/middle and high pixel-rate regions. Various FoM considering different performance factors are defined. The defined FoM are applied to surveyed data on reported CISs using column-parallel ADCs which are categorized into 4 types; single slope, SAR, cyclic and delta-sigma ADCs. The FoM defined by (noise)2(power)/(pixel-rate) separately for low/middle and high pixel-rate regions well explains the frontline of the CIS' performance in all the pixel rates. Using the FoM defined by (noise)2(power)/(intrascene dynamic range)(pixel-rate), the effectiveness of recently-reported techniques for extended-dynamic-range CISs is clarified.

A 12-bit 1.25MS/s cyclic analog-to-digital converter (ADC) is designed and fabricated in 90nm CMOS technology, and only occupies an active area as small as 0.037mm2. The proposed ADC is composed of a non-binary AD convertion stage, and a on-chip non-binary-to-binary digital block includes a built-in radix-value self-estimation scheme. Therefore, althouh a non-binary convertion architechture is adopted, the proposed ADC is the same as other stand-alone binary ADCs. The redundancy of non-binary 1-bit/step architecture relaxes the accuracy requirement on analog components of ADC. As a result, the implementation of analog circuits such as amplifier and comparator becomes simple, and high-density Metal-Oxide-Metal (MOM) capacitors can be used to achieve a small chip area. Furthermore, the novel radix-value self-estimation technique can be realized by only simple logic circuits without any extra analog input, so that the total active area of ADC is dramatically reduced. The prototype ADC achieves a measured peak signal-to-noise-and-distortion-ratio (SNDR) of 62.3dB using a poor DC gain amplifier as low as 45dB and MOM capacitors without any careful layout techniques to improve the capacitor matching. The proposed ADC dissipated 490µW in analog circuits at 1.4V power supply and 1.25Msps (20MHz clocking). The measured DNL is +0.94/-0.71LSB and INL is +1.9/-1.2LSB at 30kHz sinusoidal input.

Proof-of-concept cyclic analog-to-digital converters (ADCs) have been designed and fabricated in 90-nm CMOS technology. The measurement results of an experimental prototype demonstrate the effectiveness of the proposed switched-capacitor (SC) architecture to realize a non-binary ADC based on β expansion. Different from the conventional binary ADC, a simple 1-bit/step structure for an SC multiplying digital-to-analog converter (MDAC) is proposed to present residue amplification by β (1 < β < 2). The redundancy of non-binary ADCs with radix β tolerates the non-linear conversion errors caused by the offsets of comparators, the mismatches of capacitors, and the finite DC gains of amplifiers, which are used in the MDAC. We also employed a radix value estimation algorithm to obtain an effective value of β for non-binary encoding; it can be realized by merely adding a simple conversion sequence and digital circuits. As a result, the power penalty of a high-gain wideband amplifier and the required accuracy of the circuit elements for a high-resolution ADC were largely relaxed so that the circuit design was greatly simplified. The implemented ADC achieves a measured peak signal-to-noise-and-distortion-ratio (SNDR) of 60.44dB, even with an op-amp with a poor DC gain (< 50dB) while dissipating 780µW in analog circuits at 1.4V and occupying an active area of 0.25 × 0.26mm2.

In this paper, a robust cyclic ADC architecture with β-encoder is proposed and circuit scheme using switched-capacitor (SC) circuit is introduced. Different from the conventional binary ADC, the redundancy of proposed cyclic ADC outputs β-expansion code and has an advantage of error correction. This feature makes ADC robust against the offset of comparator capacitor mismatch and finite DC gain of amplifier in multiplying-DAC (MDAC). Because the power penalty of high-gain wideband amplifier and the required accuracy of circuit elements for high resolution ADC can be relaxed, the proposed architecture is suitable for deep submicron CMOS technologies beyond 90 nm. We also propose a β-value estimation algorithm to realize high accuracy ADC based on β-expansion. The simulation results show the effectiveness of proposed architecture and robustness of β-encoder.