In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.

In this paper, we propose a technique to synthesize a hardware circuit from a protocol specification consisting of several concurrent EFSMs with multi-rendezvous specified among their subsets. In our class, each multi-rendezvous can be specified among more than two EFSMs, and several multi-rendezvous can be specified for different combinations of EFSMs. In the proposed technique, using the information such as current states of EFSMs, input values at external gates and guard expressions, we compose a circuit to evaluate whether each multi-rendezvous can be executed. If several exclusive multi-rendezvous get executable simultaneously for some combinations of EFSMs, we select one of them according to the priority order given in advance. We compose such a circuit as a combinational logic circuit so that it works fast. By applying our technique to Abracadabra protocol specified in LOTOS, it is confirmed that the derived circuit handles multi-rendezvous efficiently.