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IEICE TRANSACTIONS on Electronics

Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology

Hiroyuki ITO, Hideyuki SUGITA, Kenichi OKADA, Tatsuya ITO, Kazuhisa ITOI, Masakazu SATO, Ryozo YAMAUCHI, Kazuya MASU

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Summary :

This paper proposes high-Q distributed constant passive devices using wafer-level chip scale package (WL-CSP) technology, which can be realized on a Si CMOS chip. A 90directional coupler using the WL-CSP technology has center frequency of 25.6 GHz, insertion loss of -0.5 dB and isolation of -29.8 dB in the measurement result. The WL-CSP technology contributes to realize low-loss RF passive devices on Si CMOS chip, which is indispensable to achieve small-size, cost-effective and low-power monolithic wireless communication circuits (MWCCs).

Publication
IEICE TRANSACTIONS on Electronics Vol.E90-C No.3 pp.641-643
Publication Date
2007/03/01
Publicized
Online ISSN
1745-1353
DOI
10.1093/ietele/e90-c.3.641
Type of Manuscript
LETTER
Category
Microwaves, Millimeter-Waves

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