IEICE TRANSACTIONS on Electronics
In-Pixel Edge Detection Circuit without Non-uniformity Correction for an Infrared Focal Plane Array (IRFPA)
Summary :
For real time image processing, a readout circuit for an infrared focal plane array (IRFPA) involving a new edge detection technique has been proposed in this letter. A non-uniformity correction unit (NUC), essential in an IRFPA because of bad non-uniformity characteristics of IR sensors is eliminated in this circuit by using a noise tolerant edge detection technique. In addition, real time edge detection can be possible, because of pixel-level integration and parallel processing. The proposed readout circuit shows an approximately three to nine times better edge error rate than other available methods using pixel-level parallel processing.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E91-C No.2 pp.235-239
- Publication Date
- 2008/02/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1093/ietele/e91-c.2.235
- Type of Manuscript
- LETTER
- Category
- Electronic Circuits
Authors
Keyword
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Chul Bum KIM, Doo Hyung WOO, Yong Soo LEE, Hee Chul LEE, "In-Pixel Edge Detection Circuit without Non-uniformity Correction for an Infrared Focal Plane Array (IRFPA)" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 2, pp. 235-239, February 2008, doi: 10.1093/ietele/e91-c.2.235.
Abstract: For real time image processing, a readout circuit for an infrared focal plane array (IRFPA) involving a new edge detection technique has been proposed in this letter. A non-uniformity correction unit (NUC), essential in an IRFPA because of bad non-uniformity characteristics of IR sensors is eliminated in this circuit by using a noise tolerant edge detection technique. In addition, real time edge detection can be possible, because of pixel-level integration and parallel processing. The proposed readout circuit shows an approximately three to nine times better edge error rate than other available methods using pixel-level parallel processing.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.2.235/_p
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@ARTICLE{e91-c_2_235,
author={Chul Bum KIM, Doo Hyung WOO, Yong Soo LEE, Hee Chul LEE, },
journal={IEICE TRANSACTIONS on Electronics},
title={In-Pixel Edge Detection Circuit without Non-uniformity Correction for an Infrared Focal Plane Array (IRFPA)},
year={2008},
volume={E91-C},
number={2},
pages={235-239},
abstract={For real time image processing, a readout circuit for an infrared focal plane array (IRFPA) involving a new edge detection technique has been proposed in this letter. A non-uniformity correction unit (NUC), essential in an IRFPA because of bad non-uniformity characteristics of IR sensors is eliminated in this circuit by using a noise tolerant edge detection technique. In addition, real time edge detection can be possible, because of pixel-level integration and parallel processing. The proposed readout circuit shows an approximately three to nine times better edge error rate than other available methods using pixel-level parallel processing.},
keywords={},
doi={10.1093/ietele/e91-c.2.235},
ISSN={1745-1353},
month={February},}
Copy
TY - JOUR
TI - In-Pixel Edge Detection Circuit without Non-uniformity Correction for an Infrared Focal Plane Array (IRFPA)
T2 - IEICE TRANSACTIONS on Electronics
SP - 235
EP - 239
AU - Chul Bum KIM
AU - Doo Hyung WOO
AU - Yong Soo LEE
AU - Hee Chul LEE
PY - 2008
DO - 10.1093/ietele/e91-c.2.235
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2008
AB - For real time image processing, a readout circuit for an infrared focal plane array (IRFPA) involving a new edge detection technique has been proposed in this letter. A non-uniformity correction unit (NUC), essential in an IRFPA because of bad non-uniformity characteristics of IR sensors is eliminated in this circuit by using a noise tolerant edge detection technique. In addition, real time edge detection can be possible, because of pixel-level integration and parallel processing. The proposed readout circuit shows an approximately three to nine times better edge error rate than other available methods using pixel-level parallel processing.
ER -
English
