IEICE TRANSACTIONS on Fundamentals
Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems
Summary :
This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E85-A No.2 pp.335-346
- Publication Date
- 2002/02/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
- Category
Authors
Haruo KOBAYASHI
Kensuke KOBAYASHI
Masanao MORIMURA
Yoshitaka ONAYA
Yuuich TAKAHASHI
Kouhei ENOMOTO
Hideyuki KOGURE
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Haruo KOBAYASHI, Kensuke KOBAYASHI, Masanao MORIMURA, Yoshitaka ONAYA, Yuuich TAKAHASHI, Kouhei ENOMOTO, Hideyuki KOGURE, "Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems" in IEICE TRANSACTIONS on Fundamentals,
vol. E85-A, no. 2, pp. 335-346, February 2002, doi: .
Abstract: This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e85-a_2_335/_p
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@ARTICLE{e85-a_2_335,
author={Haruo KOBAYASHI, Kensuke KOBAYASHI, Masanao MORIMURA, Yoshitaka ONAYA, Yuuich TAKAHASHI, Kouhei ENOMOTO, Hideyuki KOGURE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems},
year={2002},
volume={E85-A},
number={2},
pages={335-346},
abstract={This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.},
keywords={},
doi={},
ISSN={},
month={February},}
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TY - JOUR
TI - Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 335
EP - 346
AU - Haruo KOBAYASHI
AU - Kensuke KOBAYASHI
AU - Masanao MORIMURA
AU - Yoshitaka ONAYA
AU - Yuuich TAKAHASHI
AU - Kouhei ENOMOTO
AU - Hideyuki KOGURE
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E85-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 2002
AB - This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.
ER -
English
