IEICE TRANSACTIONS on transactions
Mechanism of Bit Line Mode Soft Error for DRAM
Summary :
This letter reports a charge collection experiment of alpha-particle-induced carriers in the cell arrays of the 1 Mb DRAM. It is indicated that this experiment is effective to estimate the soft error rate of VLSI memories with various kinds of structures.
- Publication
- IEICE TRANSACTIONS on transactions Vol.E70-E No.11 pp.1060-1061
- Publication Date
- 1987/11/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section LETTER (Special Issue: Papers from 1987 National Conference on Semicondutor Devices and Materials IEICE)
- Category
- Semiconductor Devices
Authors
Keyword
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Mikio ASAKURA, Yoshio MATSUDA, Katsuhiro TSUKAMOTO, Kazuyasu FUJISHIMA, Tsutomu YOSHIHARA, "Mechanism of Bit Line Mode Soft Error for DRAM" in IEICE TRANSACTIONS on transactions,
vol. E70-E, no. 11, pp. 1060-1061, November 1987, doi: .
Abstract: This letter reports a charge collection experiment of alpha-particle-induced carriers in the cell arrays of the 1 Mb DRAM. It is indicated that this experiment is effective to estimate the soft error rate of VLSI memories with various kinds of structures.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e70-e_11_1060/_p
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@ARTICLE{e70-e_11_1060,
author={Mikio ASAKURA, Yoshio MATSUDA, Katsuhiro TSUKAMOTO, Kazuyasu FUJISHIMA, Tsutomu YOSHIHARA, },
journal={IEICE TRANSACTIONS on transactions},
title={Mechanism of Bit Line Mode Soft Error for DRAM},
year={1987},
volume={E70-E},
number={11},
pages={1060-1061},
abstract={This letter reports a charge collection experiment of alpha-particle-induced carriers in the cell arrays of the 1 Mb DRAM. It is indicated that this experiment is effective to estimate the soft error rate of VLSI memories with various kinds of structures.},
keywords={},
doi={},
ISSN={},
month={November},}
Copy
TY - JOUR
TI - Mechanism of Bit Line Mode Soft Error for DRAM
T2 - IEICE TRANSACTIONS on transactions
SP - 1060
EP - 1061
AU - Mikio ASAKURA
AU - Yoshio MATSUDA
AU - Katsuhiro TSUKAMOTO
AU - Kazuyasu FUJISHIMA
AU - Tsutomu YOSHIHARA
PY - 1987
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E70-E
IS - 11
JA - IEICE TRANSACTIONS on transactions
Y1 - November 1987
AB - This letter reports a charge collection experiment of alpha-particle-induced carriers in the cell arrays of the 1 Mb DRAM. It is indicated that this experiment is effective to estimate the soft error rate of VLSI memories with various kinds of structures.
ER -
English
