A two-phase boosted voltage (VPP) generator circuit was proposed for use in giga-bit DRAMs. It reduced the maximum gate oxide voltage of pass transistor and the lower limit of supply voltage to VPP and VTN respectively while those for the conventional charge pump circuit are VPP+VDD and 1.5 VTN respectively. Also the pumping current was increased in the new circuit.

A fully on-chip current controlled open-drain output driver using a bandgap reference current generator was designed for high bandwidth DRAMs. It reduces the overhead of receiving a digital code from an external source for the compensation of the temperature and supply voltage variations. The correct value of the current control register is updated at the end of every auto refresh cycle. The operation at the data rate up to 0.8 Gb/s was verified by SPICE simulation using a 0.22 µm triple-well CMOS technology.