1-5hit |
Hiroyuki MORIMOTO Hiroki KOIKE Kazuyuki NAKAMURA
This paper describes a new technique for the design of 3-terminal regulators in which the output voltage level can be adjusted without additional terminals or extra off-chip components. This circuit restricts the increase in the number of terminal pins by using a pin as both a voltage supply output and a voltage setup input. The voltage setup information is introduced using a serial control signal from outside the chip. Using the intermediate voltage level between the supply voltage and the regulator output, the adjustment data in the internal nonvolatile memory are safely updated without noise disturbance. To input the setup information into the chip in a stable manner, we developed a new 1-wire serial interface which combines key pattern matching and burst signal detection. To ensure high reliability, we suggested a quantitative method for evaluating the influence of noise in our new interface using a simple model with superimposed random noise. Circuits additional to those for a conventional 3-terminal regulator, include a 1-wire serial communication circuit, a low-capacity non-volatile memory, and a digital to analog (D/A) converter. A test chip was developed using 0.35 µm standard CMOS process, and there was almost no overhead to the conventional 3-terminal regulator in both chip area and power dissipation. In an on-board test with the test chip, we confirmed successful output voltage adjustment from 1.0 V to 2.7 V with approximately 6.5 mV precision.
Hui QIN Tsutomu SASAO Munehiro MATSUURA Shinobu NAGAYAMA Kazuyuki NAKAMURA Yukihiro IGUCHI
A look-up table (LUT) cascade is a new type of a programmable logic device (PLD) that provides an alternative way to realize multiple-output functions. An LUT ring is an emulator for an LUT cascade. Compared with an LUT cascade, the LUT ring is more flexible. In this paper we discuss the realization of multiple-output functions with the LUT ring. Unlike an FPGA realization of a logic function, accurate prediction of the delay time is easy in an LUT ring realization. A prototype of an LUT ring has been custom-designed with 0.35 µm CMOS technology. Simulation results show that the LUT ring is 80 to 241 times faster than software programs on an SH-1, and 36 to 93 times faster than software programs on a PentiumIII when the frequencies for the LUT ring and the MPUs are the same, but is slightly slower than commercial FPGAs.
Masakazu KURISU Muneo FUKAISHI Hiroshi ASAZAWA Masato NISHIKAWA Kazuyuki NAKAMURA Michio YOTSUYANAGI
In this paper, we briefly review the recent research on CMOS gigahertz-rate communication circuits. Then, we describe design innovations we have made to overcome limitations on communication speed. Using 0. 25-µm CMOS technology, we developed a 4.25-Gb/s Fibre Channel transceiver that features an asynchronous tree-type 1 : 8 demultiplexer and an 8-bit-to-10-bit frequency-conversion architecture. And using 0. 15-µm CMOS technology, we developed an 11. 8-GHz frequency divider that introduces the novel idea of a hysteresis-controlled latch (HC-latch). With these results, we discuss high-speed LSI design issues and future prospects.
Kazuyuki NAKAMURA Masahide TAKADA Toshio TAKESHIMA Kouichirou FURUTA Tohru YAMAZAKI Kiyotaka IMAI Susumu OHI Yumi SEKINE Yukio MINATO Hisamitsu KIMOTO
A novel logic functional level converter (FLC) was developed to achieve a high speed ECL I/O BiCMOS SRAM. The FLC simultaneously enables high speed logic operation and ECL to CMOS level conversion. This paper describes an optimized design method for the FLC and an improved FLC. In addition, a high speed partial decoding level converter (PDLC), composed of improved FLCs, is presented. The FLC and a newly developed address decoding sheme with PDLCs, are keys to the successful production of the 5ns 1Mb ECL I/O BiCMOS SRAM.
Kazuyuki NAKAMURA Shigeru KUHARA Thoru KIMURA Masahide TAKADA Hisamitsu SUZUKI Hiroshi YOSHIDA Tohru YAMAZAKI
PLL timing design techniques introduced here feature (1) a word-line resetting-equalization scheme for reducting the access time and the memory cell current, (2) a cyclic input buffer power-cutting scheme to reduce the excess power in low-frequency operation, and (3) a super-pipelined parallel test scheme which allows the evaluation of high-speed LSIs by low-speed LSI testers to reduce the test costs. These techniques successfully contribute to the development of a 7 ns GTL I/O 16 Mb BiCMOS SRAM LSI.