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[Author] Kenichi YASUDA(3hit)

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  • A Mixed-Mode Voltage Down Converter with Impedance Adjustment Circuitry for Low-Voltage High-Frequency Memories

    Tsukasa OOISHI  Yuichiro KOMIYA  Kei HAMADE  Mikio ASAKURA  Kenichi YASUDA  Kiyohiro FURUTANI  Tetsuo KATO  Hideto HIDAKA  Hideyuki OZAKI  

     
    PAPER-Memory

      Vol:
    E79-C No:7
      Page(s):
    986-996

    This paper proposes a low voltage operation technique for a voltagedown converter(VDC) using a mixed-mode VDC(MM-VDC), that combines an analog VDC and a digital VDC, and provides high frequency application using an impedance adjustment circuitry (LAC). The MM-VDC operates with a small response delay and a large supply current. Moreover, the IAC is adopted to the MM-VDC for wide range frequency operation under low voltage conditions. The IAC can change the supply current capability in accordance with the load operation frequency to avoid the overshoot and undershoot problpems caused by the unmatched supply current. A 64 Mb-DRAM test device operated with the MM-VDC achieves well-controlled internal voltage (VCI) level and achieves high frequency operation. These systems, the MM-VDC and the ILVDC, can be applicable for both low voltage and high frequency operation.

  • An Automatic Temperature Compensation of Internal Sense Ground for Subquarter Micron DRAM's

    Tsukasa OOISHI  Yuichiro KOMIYA  Kei HAMADE  Mikio ASAKURA  Kenichi YASUDA  Kiyohiro FURUTANI  Hideto HIDAKA  Hiroshi MIYAMOTO  Hideyuki OZAKI  

     
    PAPER

      Vol:
    E78-C No:6
      Page(s):
    719-727

    This paper describes DRAM array driving techniques and the parameter scaling techniques for a low voltage operation using the boosted sense ground (BSG) scheme and further improved methods. A temperature compensation and adjustable internal voltage levels maintain a small subthreshold leakage current of a memory cell transistor (MC-Tr), and a distributed BSG (DBSG) scheme and a column decoded sensing (CDS) scheme achieve the effective scaling. These schemes can set the DRAM array free from a leakage current problem and free them from an influence of temperature variations. Therefore, parameters for the MC-Tr, threshold voltage (Vth), and the boosted voltage for the gate bias can be scaled down, and it is possible to determine the Vth of the MC-Tr easy (0.45 V at K = 0.4) for the satisfaction of the small leakage current, for the high speed and stable operation, and for the high reliability (VPP is below 2 VCC). They are applicable to the subquarter micron DRAM's of 256 Mb and more.

  • An Intelligent Cache Memory Chip Suitable for Logical Inference

    Kenichi YASUDA  Kiyohiro FURUTANI  Atsushi MAEDA  Shoichi WAKANO  Hiroshi NAKASHIMA  Yasutaka TAKEDA  Michihiro YAMADA  

     
    PAPER-System VLSI

      Vol:
    E74-C No:11
      Page(s):
    3796-3802

    We have newly developed a VLSI intelligent cache memory chip which constitutes one processor element of a Parallel Inference Machine (PIM/m) system. This cache memory chip contains 610 k transistors including 80 kbits memory cells. The chip measures 14.47 mm14.84 mm and is fabricated by using 1.0µm CMOS double metal technology. The cache memory chip implements a hardware support called "Trail Buffer" which is suitable for the execution of logic programming languages. We have determined the cache memory size by practical simulation taking the relationship between the chip size and hitratio of the cache memory into consideration. The scan test method and the special commands to access every memory cell are applied to enhance the testability. This chip itself operates at a cycle time of 30 MHz. The typical power consumption is 2.5 W with a 5.5 V power supply at 16.7 MHz operation. With this cache memory chip, the CPU board of the PIM/m is now tuned for 16.7 MHz operation and has attained 1.5 MLIPS (logical inference per second), which is the highest performance as an inference machine in the world.