Array redistribution is required very often in programs on distributed memory parallel computers. It is essential to use efficient algorithms for redistribution, otherwise the performance of programs may degrade considerably. In this paper, we focus on automatic generation of communication routines for multi-dimensional redistribution. The principal advantage of this work is to gain the ability to handle redistribution between arbitrary source and destination processor sets and between arbitrary source and destination distribution schemes. We have implemented these algorithms using Parallelware communication library. Some experimental results show the efficiency and flexibility of our techniques compared to the other redistribution works.

Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.