A New Method for Low-Capture-Power Test Generation for Scan Testing
Summary :
Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
- Publication
- IEICE TRANSACTIONS on Information Vol.E89-D No.5 pp.1679-1686
- Publication Date
- 2006/05/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e89-d.5.1679
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
Authors
Keyword
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Xiaoqing WEN, Yoshiyuki YAMASHITA, Seiji KAJIHARA, Laung-Terng WANG, Kewal K. SALUJA, Kozo KINOSHITA, "A New Method for Low-Capture-Power Test Generation for Scan Testing" in IEICE TRANSACTIONS on Information,
vol. E89-D, no. 5, pp. 1679-1686, May 2006, doi: 10.1093/ietisy/e89-d.5.1679.
Abstract: Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e89-d.5.1679/_p
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@ARTICLE{e89-d_5_1679,
author={Xiaoqing WEN, Yoshiyuki YAMASHITA, Seiji KAJIHARA, Laung-Terng WANG, Kewal K. SALUJA, Kozo KINOSHITA, },
journal={IEICE TRANSACTIONS on Information},
title={A New Method for Low-Capture-Power Test Generation for Scan Testing},
year={2006},
volume={E89-D},
number={5},
pages={1679-1686},
abstract={Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.},
keywords={},
doi={10.1093/ietisy/e89-d.5.1679},
ISSN={1745-1361},
month={May},}
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TY - JOUR
TI - A New Method for Low-Capture-Power Test Generation for Scan Testing
T2 - IEICE TRANSACTIONS on Information
SP - 1679
EP - 1686
AU - Xiaoqing WEN
AU - Yoshiyuki YAMASHITA
AU - Seiji KAJIHARA
AU - Laung-Terng WANG
AU - Kewal K. SALUJA
AU - Kozo KINOSHITA
PY - 2006
DO - 10.1093/ietisy/e89-d.5.1679
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E89-D
IS - 5
JA - IEICE TRANSACTIONS on Information
Y1 - May 2006
AB - Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
ER -
English
