In this paper, we propose a novel gate delay time mismatch tolerant time-mode signal accumulator whose input and output are represented by a time difference of two digital signal transitions. Within the proposed accumulator, the accumulated value is stored as the time difference between the two pulses running around the same ring of a delay line, so that there is no mismatch between the periods of the two pulses, thus the output drift of the accumulator is suppressed in principle without calibrating mismatch of two rings, which is used to store the accumulated value in the conventional one. A prototype of the proposed accumulator was fabricated in 180nm CMOS. The accumulating operation is confirmed by both time and frequency domain experiments. The standard deviation of the error of the accumulating operation is 9.8ps, and compared with the previous work, the peak error over full-scale is reduced by 46% without calibrating the output drift.

A 4th-order programmable continuous-time filter (CTF) for hard-disk-drive (HDD) read channels was developed with 65-nm CMOS process technology. The CTF cutoff frequency and boost are programmable by switching units of the operational trans-conductance amplifier (OTA) banks and the capacitor banks. The switches are operated by lifted local-supply voltage to reduce on-resistance of the transistors. The CTF characteristics were robust against process technology variations and supply voltage and temperature ranges due to the introduction of a digitally assisted compensation scheme with analog auto-tuning circuits and digital calibration sequences. The digital calibration sequences, which fit into the operation sequence of the HDD read channel, compensate for the tuning circuits of the process technology variations, and the tuning circuits compensate for the CTF characteristics over the supply voltage and temperature ranges. As a result, the CTF had a programmability of 100–1000-MHz cutoff frequency and 0–12-dB boost.

This paper presents analysis and design of a new ultra-low voltage analog front end (AFE) dedicated to strain sensor applications. The AFE, designed in 0.18 µm CMOS process, features a chopper-stabilized instrumentation amplifier (IA), a balanced active MOSFET-C 2nd order low pass filter (LPF), a clock generator and a voltage booster which operate at supply voltage (Vdd) of 0.6 V. The designed IA achieves 30 dB of closed-loop gain, 101 dB of common-mode rejection ratio (CMRR) at 50 Hz, 80 dB of power-supply rejection ratio (PSRR) at 50 Hz, thermal noise floor of 53.4 nV/, current consumption of 14 µA, and noise efficiency factor (NEF) of 9.7. The high CMRR and rail-to-rail output swing capability is attributed to a new low voltage realization of the active-bootstrapped technique using a pseudo-differential gain-boosting operational transconductance amplifier (OTA) and proposed current-driven bulk (CDB) biasing technique. An output capacitor-less low-dropout regulator (LDO), with a new fast start-up LPF technique, is used to regulate this 0.6 V supply from a 0.8–1.0 V energy harvesting power source. It achieves power supply rejection (PSR) of 42 dB at frequency of 1 MHz. A cascode compensated pseudo differential amplifier is used as the filter's building block for low power design. The filter's single-ended-to-balanced converter is implemented using a new low voltage amplifier with two-stage common-mode cancellation. The overall AFE was simulated to have 65.6 dB of signal-to-noise ratio (SNR), total harmonic distortion (THD) of less than 0.9% for a 100 Hz sinusoidal maximum input signal, bandwidth of 2 kHz, and power consumption of 51.2 µW. Spectre RF simulations were performed to validate the design using BSIM3V3 transistor models provided by GLOBALFOUNDRIES 0.18 µm CMOS process.