At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when a test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs as possible inactive by disabling corresponding clock control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to equalize the input and output values in Stage-2 of as many remaining active FFs as possible (FF-Silencing). CTX effectively reduces launch switching activity and thus yield loss risk even when only a small number of don't care (X) bits are present (as in test compression) without any impact on test data volume, fault coverage, performance, or circuit design.

We have developed a low-power, high-performance MPEG-4 codec LSI for mobile video applications. This codec LSI is capable of up to CIF 30-fps encoding, making it suitable for various visual applications. The measured power consumption of the codec core was 9 mW for QCIF 15-fps codec operation and 38 mW for CIF 30-fps encoding. To provide an error-robust MPEG-4 codec, we implemented an error-resilience function in the LSI. We describe the techniques that have enabled low power consumption and high performance and discuss our test results.