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[Keyword] common-mode voltage(3hit)

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  • An Ultra-Low-Voltage, Wide Signal Swing, and Clock-Scalable Dynamic Amplifier Using a Common-Mode Detection Technique

    James LIN  Masaya MIYAHARA  Akira MATSUZAWA  

     
    PAPER-Circuit Design

      Vol:
    E97-A No:12
      Page(s):
    2400-2410

    This paper proposes an ultra-low-voltage, wide signal swing, and clock-scalable differential dynamic amplifier using a common-mode voltage detection technique. The essential characteristics of an amplifier, such as gain, linearity, power consumption, noise, etc., are analyzed. In measurement, the proposed dynamic amplifier achieves a 13dB gain with less than 1dB drop over a differential output signal swing of 340mVpp with a supply voltage of 0.5V. The attained maximum operating frequency is 700MHz. With a 0.7V supply, the gain increases to 16dB with a signal swing of 700mVpp. The prototype amplifier is fabricated in 90nm CMOS technology with the low threshold voltage and the deep N-well options.

  • A 0.7-V Opamp in Scaled Low-Standby-Power FinFET Technology

    Shin-ichi O'UCHI  Kazuhiko ENDO  Takashi MATSUKAWA  Yongxun LIU  Tadashi NAKAGAWA  Yuki ISHIKAWA  Junichi TSUKADA  Hiromi YAMAUCHI  Toshihiro SEKIGAWA  Hanpei KOIKE  Kunihiro SAKAMOTO  Meishoku MASAHARA  

     
    PAPER

      Vol:
    E95-C No:4
      Page(s):
    686-695

    This paper demonstrates a FinFET operational amplifier (opamp), which is suitable to be integrated with digital circuits in a scaled low-standby-power (LSTP) technology and operates at extremely low voltage. The opamp is consisting of an adaptive threshold-voltage (Vt) differential pair and a low-voltage source follower using independent-double-gate- (IDG-) FinFETs. These two components enable the opamp to extend the common-mode voltage range (CMR) below the nominal Vt even if the supply voltage is less than 1.0 V. The opamp was implemented by our FinFET technology co-integrating common-DG- (CDG-) and IDG-FinFETs. More than 40-dB DC gain and 1-MHz gain-bandwidth product in the 500-mV-wide input CMR at the supply voltage of 0.7 V was estimated with SPICE simulation. The fabricated chip successfully demonstrated the 0.7-V operation with the 480-mV-wide CMR, even though the nominal Vt was 400 mV.

  • A Novel Non-contact Capacitive Probe for Common-Mode Voltage Measurement

    Ryuichi KOBAYASHI  Yoshiharu HIROSHIMA  Hidenori ITO  Hiroyuki FURUYA  Mitsuo HATTORI  Yasuhiko TADA  

     
    PAPER-Measurement and Immunity

      Vol:
    E90-B No:6
      Page(s):
    1329-1337

    This paper describes a capacitive voltage probe (CVP) that can measure a common-mode voltage on a cable without touching its conductor. This CVP has two coaxial electrodes: the inner electrode works as a voltage pickup and the outer one shields the inner electrode. These electrodes separate into two parts for clamping to the cable. Using a high input impedance circuit, this probe measures the common-mode voltage by detecting the voltage difference between the two electrodes. The probe characteristics are evaluated by measuring its linearity and frequency response. The results show that this probe has a dynamic range of 100 dB and flat frequency response from 10 kHz to 30 MHz. Deviations in sensitivity due to the position of the clamped cable in the inner electrode and to differences in the cable radius are evaluated theoretically and experimentally. The results indicate that the influence of the cable position can be calibrated. Finally, measured data obtained using both an impedance stabilizing network (ISN) and a CVP are compared to confirm the validity of the CVP. The results show that data measured by the CVP closely agreed with that obtained by the ISN. Therefore, the CVP is useful for EMC measurements to evaluate common-mode disturbances.