In this paper, an accurate experimental noise model to improve the EEHEMT nonlinear model using the Verilog-A language in Agilent ADS is presented for the first time. The present EEHEMT model adopts channel noise to model the noise behavior of pseudomorphic high electron mobility transistor (pHEMT). To enhance the accuracy of the EEHEMT noise model, we add two extra noise sources: gate shot noise and induced gate noise current. Here we demonstrate the power spectral density of the channel noise Sid and gate noise Sig versus gate-source voltage for 0.25 µm pHEMT devices. Additionally, the related noise source parameters, i.e., P, R, and C are presented. Finally, we compare four noise parameters between the simulation and model, and the agreement between the measurement and simulation results shows that this proposed approach is dependable and accurate.

This paper introduces a fast image denoising algorithm by estimating noise parameters without prior information about the noise. Under the assumption that additive noise has a Gaussian distribution, the noise parameters were estimated from an observed degraded image, and were used to define the constraints of a noise detection process that was coupled with a Markov random field (MRF). In addition, an adaptive modified weighted Gaussian filter with variable window sizes defined by the constraints on noise detection was used to control the degree of smoothness of the reconstructed image. Experimental results demonstrate the capability of the proposed algorithm.

The downscaling of CMOS technology has resulted in strong improvement in RF performance of bulk and SOI MOSFETs. In order to realize a low-noise RF circuit, a deeper understanding of the noise performance for MOSFETs is required. Thermal noise is the main noise source of the CMOS device for high frequency performance, and is dominated by the drain channel noise, induced gate noise, and their correlation noise. In this work, we measured the RF noise parameter (Fmin, Rn, Γ opt) of 45 nm node MOSFETs from 5 to 15 GHz and extracted noise sources and noise coefficients P, R, and C by using an extended van der Ziel's model. We found, for the first time, that correlation coefficient C decreases from positive to negative values when the gate length is reduced continuously with the gate length of sub-100 nm. We confirmed that Pucel's noise figure model, using noise coefficients P, R, and C, can be considered a good approximation even for sub-50 nm MOSFETs. We also discussed a scaling effect of the noise coefficients, especially the correlation noise coefficient C on the minimum noise figure.

In this letter, a new computation method for the noise parameters of a linear noisy two-port network is introduced. A new error function, which considers noise figure and source admittance error simultaneously, is proposed to estimate the four noise parameters. The global optimization of the error function is searched directly by using a genetic algorithm.

In this paper, a novel noise parameters extraction technique for microwave packaged BJT and FET is proposed. The noise parameters of packaged BJT and FET for the entire operating frequency band can be obtained from the four noise parameters measured at a single frequency or a few frequencies. The predicated results obtained with this method agree well with the measured data. As a result, the novel noise parameters extraction technique can be used to predict the noise with a minimum effort.

A precise method for determining AlGaAs/GaAs HBT large-signal circuit parameters is presented. In this method, the parameters are extracted from noise parameters and small-signal S-parameters measured under various bias conditions. The measured noise parameters are fitted to the calculated noise parameters derived from an approximation of Hawkins' equations applied to the macroscopic equivalent circuit. The small-signal S-parameters help to determine the large-signal circuit parameters. The derived large-signal parameters were used to design an HBT oscillator. The simulated results using these parameters were in good agreement with the fabricated device performance.