High-speed flash ADCs are useful in high-speed applications such as communication receivers. Due to offset voltage variation in the sub-micron processes, the power consumption and the area increase significantly to suppress variation. As an alternative to suppressing the variation, we have developed a flash ADC architecture that selects the comparators based on offset voltage ranking for reference generation. Specifically, with the order statistics as a basis, our method selects the minimum number of comparators to obtain equally spaced reference values. Because the proposed ADC utilizes offset voltages as references, no resistor ladder is required. We also developed a time-domain sorting mechanism for the offset voltages to achieve on-chip comparator selection. We first perform a detailed analysis of the order statistics based selection method and then design a 4-bit ADC in a commercial 65-nm process and perform transistor-level simulation. When using 127 comparators, INLs of 20 virtual chips are in the range of -0.34LSB/+0.29LSB to -0.83LSB/+0.74LSB, and DNLs are in the range of -0.33LSB/+0.24LSB to -0.77LSB/+1.18LSB at 1-GS/s operation. Our ADC achieves the SNDR of 20.9dB at Nyquist-frequency input and the power consumption of 0.84mW.

This paper presents a self-calibrating dynamic latched comparator with a stochastic offset voltage detector that can be realized by using simple digital circuitry. An offset voltage of the comparator is compensated by using a statistical calibration scheme, and the offset voltage detector uses the uncertainty in the comparator output. Thanks to the simple offset detection technique, all the calibration circuitry can be synthesized using only standard logic cells. This paper also gives a design methodology that can provide the optimal design parameters for the detector on the basis of fundamental statistics, and the correctness of the design methodology was statistically validated through measurement. The proposed self-calibrating comparator system was fabricated in a 180 nm 1P6M CMOS process. The prototype achieved a 38 times improvement in the three-sigma of the offset voltage from 6.01 mV to 158 µV.

We propose a low-noise and low-power dynamic comparator with an offset calibration circuit for Low-Power ADCs. The proposed comparator equips the control circuit in order to switching the comparison accuracy and the current consumption. When high accuracy is not required, current consumption is reduced by allowing the noise increase. Compared with a traditional dynamic comparator, the proposed architecture reduced the current consumption to 78% at 100MHz operating and 1.8V supply voltage. Furthermore, the offset voltage is corrected with minimal current consumption by controlling the on/off operation of the offset calibration circuit.

We propose a capacitive averaging technique applied to a double-tail latched comparator without a preamplifier for an offset reduction technique. Capacitive averaging can be introduced by considering the first stage of the double-tail latched comparator as a capacitive loaded amplifier. This makes it possible to reduce the offset voltage while preventing an increase in power dissipation. A positive feedback technique is also used for the first stage, which maximizes the effectiveness of the capacitive averaging. The capacitive averaging mechanism and the relationship between the offset reduction and the linearity of the amplifier is discussed in detail. Simulation results for a 90-nm CMOS process show that the proposed technique can reduce the offset voltage by 1/3.5 (3 mV) at a power dissipation of only 45 µW.

It has been reported that the efficiency of a low voltage power supply is improved by replacing diodes in an output-stage with synchronous rectifiers (SR). A SR consists of a bipolar junction transistor with a low-saturation voltage and a current transformer. Although the SR has low offset-voltage, its reverse recovery characteristic is usually poor. In this paper, an RCD circuit which improves the reverse recovery characteristic of the SR is proposed. This circuit is simple, and it is composed of a diode, a capacitor and a resistor. The analysis and the experimental results of the SR with the proposed RCD circuit are presented. The optimum design of the RCD to improve the reverse recovery characteristic of SR is discussed.