A new 1.25-Gb/s digitally-controlled dual-loop clock and data recovery circuit is realized. To overcome jitter problems caused by the phase resolution limit, the CDR has two phase generation stages: coarse generation by a phase interpolator and fine generation by a variable delay buffer. The performance of the proposed CDR was verified by behavioral and transistor-level simulations. A prototype CDR chip fabricated with 0.18 µm CMOS process shows error-free operation for 400 ppm frequency offset. The chip occupies 165255 µm2 and consumes 17.8 mW.

This paper describes an all-digital DLL (Delay Locked Loop) circuit with a high phase resolution. The proposed architecture is based on three-stage phase tuning blocks for coarse, fine and ultra fine phase control. Each block has a phase detector, a phase selection block and a delay line, respectively. It was simulated in a 0.35 µm CMOS technology under 3.3 V power supply. The simulation result shows the maximum phase error can be reduced to 13-42 ps with the operating range of 250 MHz to 800 MHz.