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IEICE TRANSACTIONS on Fundamentals

A Novel Model for Computing the Effective Capacitance of CMOS Gates with Interconnect Loads

Zhangcai HUANG, Atsushi KUROKAWA, Yasuaki INOUE, Junfa MAO

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Summary :

In deep submicron designs, the interconnect wires play a major role in the timing behavior of logic gates. The effective capacitance Ceff concept is usually used to calculate the delay of gate with interconnect loads. In this paper, we present a new method of Integration Approximation to calculate Ceff. In this new method, the complicated nonlinear gate output is assumed as a piecewise linear (PWL) waveform. A new model is then derived to compute the value of Ceff. The introduction of Integration Approximation results in Ceff being insensitive to output waveform shape. Therefore, the new method can be applied to various output waveforms of CMOS gates with RC-π loads. Experimental results show a significant improvement in accuracy.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E88-A No.10 pp.2562-2569
Publication Date
2005/10/01
Publicized
Online ISSN
DOI
10.1093/ietfec/e88-a.10.2562
Type of Manuscript
Special Section PAPER (Special Section on Nonlinear Theory and its Applications)
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