Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
Summary :
This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E87-A No.12 pp.3318-3323
- Publication Date
- 2004/12/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
- Category
- Test
Authors
Keyword
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Kazumi HATAYAMA, Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Yasuo SATO, Takaharu NAGUMO, "Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs" in IEICE TRANSACTIONS on Fundamentals,
vol. E87-A, no. 12, pp. 3318-3323, December 2004, doi: .
Abstract: This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e87-a_12_3318/_p
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@ARTICLE{e87-a_12_3318,
author={Kazumi HATAYAMA, Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Yasuo SATO, Takaharu NAGUMO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs},
year={2004},
volume={E87-A},
number={12},
pages={3318-3323},
abstract={This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3318
EP - 3323
AU - Kazumi HATAYAMA
AU - Michinobu NAKAO
AU - Yoshikazu KIYOSHIGE
AU - Koichiro NATSUME
AU - Yasuo SATO
AU - Takaharu NAGUMO
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E87-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2004
AB - This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.
ER -
English
