We built a 12.4 mm12.4 mm, 45-nm CMOS, chip that integrates eight 648-MHz general purpose cores, two matrix processor (MX-2) cores, four flexible engine (FE) cores and media IP (VPU5) to establish heterogeneous multi-core chip architecture. The general purpose core had its IPC (instructions per cycle) performance enhanced by adding 32-bit instructions to the existing 16-bit fixed-length instruction set and executing up to two 32-bit instructions per cycle. Considering these five-to-seven years of embedded LSI and increasing trend of access-master within LSI, we predict that the memory usage of single core will not exceed 32-bit physical area (i.e. 4 GB), but chip-total memory usage will exceed 4 GB. Based on this prediction, the physical address was expanded from 32-bit to 40-bit. The fabricated chip was tested and a parallel operation of eight general purpose cores and four FE cores and eight data transfer units (DTU) is obtained on AAC (Advanced Audio Coding) encode processing.

A SuperHTM embedded processor core implemented in a 130-nm CMOS process running at 400 MHz achieved 720 MIPS and 2.8 GFLOPS at a power of 250 mW in worst-case conditions. It has a dual-issue seven-stage pipeline architecture but maintains the 1.8 MIPS/MHz of the previous five-stage processor. The processor meets the requirements of a wide range of applications, and is suitable for digital appliances aimed at the consumer market, such as cellular phones, digital still/video cameras, and car navigation systems.

This paper presents a practical fault model for delay testing, called a multiple-threshold gate-delay fault model, to obtain high quality tests that guarantee the detection of delay faults for various extra-delays. Fault efficiencies for multiple thresholds of the extra-delay are introduced as a coverage metric that describes the quality of tests. Our approach guarantees that each gate-delay fault is tested on the path that is almost the longest one passing through the faulty line by using two-pattern tests with pattern-independent timing. We present the procedures of the path selection, fault simulation, and the test generation, where the path-status graph technique is used as not to rely on the enumeration of paths. Experimental results for benchmark circuits demonstrate that the proposed metric gives useful information that transition fault efficiency cannot, and that the proposed test generation can achieve high fault efficiencies for multiple-threshold gate-delay faults.

This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.

This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.