Deterministic Built-in Test with Neighborhood Pattern Generator
Summary :
This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.5 pp.874-883
- Publication Date
- 2002/05/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Fault Tolerance
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Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Kazumi HATAYAMA, Satoshi FUKUMOTO, Kazuhiko IWASAKI, "Deterministic Built-in Test with Neighborhood Pattern Generator" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 5, pp. 874-883, May 2002, doi: .
Abstract: This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_5_874/_p
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@ARTICLE{e85-d_5_874,
author={Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Kazumi HATAYAMA, Satoshi FUKUMOTO, Kazuhiko IWASAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Deterministic Built-in Test with Neighborhood Pattern Generator},
year={2002},
volume={E85-D},
number={5},
pages={874-883},
abstract={This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.},
keywords={},
doi={},
ISSN={},
month={May},}
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TY - JOUR
TI - Deterministic Built-in Test with Neighborhood Pattern Generator
T2 - IEICE TRANSACTIONS on Information
SP - 874
EP - 883
AU - Michinobu NAKAO
AU - Yoshikazu KIYOSHIGE
AU - Koichiro NATSUME
AU - Kazumi HATAYAMA
AU - Satoshi FUKUMOTO
AU - Kazuhiko IWASAKI
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 5
JA - IEICE TRANSACTIONS on Information
Y1 - May 2002
AB - This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
ER -
English
