RFID enable applications are ubiquitous in our society, especially become more and more important as IoT management rises. Meanwhile, the concern of security and privacy of RFID is also increasing. The pseudorandom number generator is one of the core primitives to implement RFID security. Therefore, it is necessary to design and implement a secure and robust pseudo-random number generator (PRNG) for current RFID tag. In this paper, we study the security of light-weight PRNGs for EPC Gen2 RFID tag which is an EPC Global standard. For this reason, we have analyzed and improved the existing research at IEEE TrustCom 2017 and proposed a model using external random numbers. However, because the previous model uses external random numbers, the speed has a problem depending on the generation speed of external random numbers. In order to solve this problem, we developed a pseudorandom number generator that does not use external random numbers. This model consists of LFSR, NLFSR and SLFSR. Safety is achieved by using nonlinear processing such as multiplication and logical multiplication on the Galois field. The cycle achieves a cycle longer than the key length by effectively combining a plurality of LFSR and the like. We show that our proposal PRNG has good randomness and passed the NIST randomness test. We also shows that it is resistant to identification attacks and GD attacks.

Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. However, the test patterns generated by LFSR reseeding generally have high toggle rate and thus cause high test power. Therefore, it is feasible to fill X bits in deterministic test cubes with 0 or 1 properly before encoding the seed to reduce toggle rate. However, X-filling will increase the number of specified bits, thus increase the difficulty of seed encoding, what's more, the size of LFSR will increase as well. This paper presents a test frame which takes into consideration both compression ratio and power consumption simultaneously. In the first stage, the proposed reseeding-oriented X-filling proceeds for shift power (shift filling) and capture power (capture filling) reduction. Then, encode the filled test cubes using the proposed Compatible Block Code (CBC). The CBC can X-ize specified bits, namely turning specified bits into X bits, and can resolve the conflict between low-power filling and seed encoding. Experiments performed on ISCAS'89 benchmark circuits show that our scheme attains a compression ratio of 94.1% and reduces capture power by at least 15% and scan-in power by more than 79.5%.

This paper presents a new parallel architecture of syndrome generator for a high-speed BCH (Bose-Chaudhuri-Hocquenghem) decoder. In particular, the proposed parallel syndrome generators are based on LFSR (linear feedback shift register) architecture to achieve high throughput without significant area overhead. From the experimental results, the proposed approach achieves 4.60 Gbps using 0.25-µm standard CMOS technology. This result is much faster than the conventional byte-wise GFM-based counterpart. The high throughputs are due to the well-tuned hardware implementation using unfolding transformation.

This work presents a novel counter-based randomization method for use in a flying-adder frequency synthesizer with a cost-effective structure that can replace the fractional accumulator. The proposed technique involves a counter, a comparator and a modified linear feedback shift register. The power consumption and speed bottleneck of the conventional flying-adder are significantly reduced. The modified linear shift feedback register is used as a pseudo random data generator, suppressing the spurious tones arise from the periodic carry sequences that is generated by the fractional accumulator. Furthermore, the proposed counter-based randomization method greatly reduces the large memory size that is required by the conventional approach to carry randomization. A test chip for the proposed counter-based randomization method is fabricated in the TSMC 0.18,$mu $m 1P6M CMOS process, with the core area of 0.093,mm$^{mathrm{2}}$. The output frequency had a range of 43.4,MHz, extasciitilde 225.8,MHz at 1.8,V with peak-to-peak jitter (Pk-Pk) jitter 139.2,ps at 225.8,MHz. Power consumption is 2.8,mW @ 225.8,MHz with 1.8 supply voltage.

A variant of the self-shrinking generator (SSG) proposed at ICISC 2006, which we call SSG-XOR, was claimed to have better cryptographic properties than SSG in a practical setting. It was also claimed that SSG-XOR will be more secure than SSG. But we show that SSG-XOR has no advantage over SSG from the viewpoint of practical cryptanalysis, especially the guess-and-determine attack.

This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.

Reseeding technique is proposed to improve the fault coverage in pseudo-random testing. However most of previous works on reseeding is based on storing the seeds in an external tester or in a ROM. In this paper we present a built-in reseeding technique for LFSR-based test pattern generation. The proposed structure can run both in pseudorandom mode and in reseeding mode. Besides, our method requires no storage for the seeds since in reseeding mode the seeds can be generated automatically in hardware. In this paper we also propose an efficient grouping algorithm based on simulated annealing to optimize test vector grouping. Experimental results for benchmark circuits indicate the superiority of our technique against other reseeding methods with respect to test length and area overhead. Moreover, since the theoretical properties of LFSRs are preserved, our method could be beneficially used in conjunction with any other techniques proposed so far.

We propose a technique of selecting seeds for the LFSR-based test pattern generators that are used in VLSI BISTs. By setting the computed seed as an initial value, target fault coverage, for example 100%, can be accomplished with minimum test length. We can also maximize fault coverage for a given test length. Our method can be used for both test-per-clock and test-per-scan BISTs. The procedure is based on vector representations over GF(2m), where m is the number of LFSR stages. The results indicate that test lengths derived through selected seeds are about sixty percent shorter than those derived by simple seeds, i.e. 0001, for a given fault coverage. We also show that seeds obtained through this technique accomplish higher fault coverage than the conventional selection procedure. In terms of the c7552 benchmark, taking a test-per-scan architecture with a 20-bit LFSR as an example, the number of undetected faults can be decreased from 304 to 227 for 10,000 LFSR patterns using our proposed technique.

The exact expected test lengths of pseudo-random patterns that are generated by LFSRs are theoretically analyzed for a CUT containing hard random-pattern-resistant faults. The exact expected test lengths are also analyzed when more than one primitive polynomials are selected.