A Per-Test Fault Diagnosis Method Based on the X-Fault Model
Summary :
This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.
- Publication
- IEICE TRANSACTIONS on Information Vol.E89-D No.11 pp.2756-2765
- Publication Date
- 2006/11/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e89-d.11.2756
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
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Keyword
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Xiaoqing WEN, Seiji KAJIHARA, Kohei MIYASE, Yuta YAMATO, Kewal K. SALUJA, Laung-Terng WANG, Kozo KINOSHITA, "A Per-Test Fault Diagnosis Method Based on the X-Fault Model" in IEICE TRANSACTIONS on Information,
vol. E89-D, no. 11, pp. 2756-2765, November 2006, doi: 10.1093/ietisy/e89-d.11.2756.
Abstract: This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e89-d.11.2756/_p
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@ARTICLE{e89-d_11_2756,
author={Xiaoqing WEN, Seiji KAJIHARA, Kohei MIYASE, Yuta YAMATO, Kewal K. SALUJA, Laung-Terng WANG, Kozo KINOSHITA, },
journal={IEICE TRANSACTIONS on Information},
title={A Per-Test Fault Diagnosis Method Based on the X-Fault Model},
year={2006},
volume={E89-D},
number={11},
pages={2756-2765},
abstract={This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.},
keywords={},
doi={10.1093/ietisy/e89-d.11.2756},
ISSN={1745-1361},
month={November},}
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TY - JOUR
TI - A Per-Test Fault Diagnosis Method Based on the X-Fault Model
T2 - IEICE TRANSACTIONS on Information
SP - 2756
EP - 2765
AU - Xiaoqing WEN
AU - Seiji KAJIHARA
AU - Kohei MIYASE
AU - Yuta YAMATO
AU - Kewal K. SALUJA
AU - Laung-Terng WANG
AU - Kozo KINOSHITA
PY - 2006
DO - 10.1093/ietisy/e89-d.11.2756
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E89-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2006
AB - This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.
ER -
English
