A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Summary :
Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
- Publication
- IEICE TRANSACTIONS on Information Vol.E96-D No.9 pp.2003-2011
- Publication Date
- 2013/09/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.E96.D.2003
- Type of Manuscript
- Special Section PAPER (Special Section on Dependable Computing)
- Category
Authors
Kohei MIYASE
Kyushu Institute of Technology
Ryota SAKAI
Kyushu Institute of Technology
Xiaoqing WEN
Kyushu Institute of Technology
Masao ASO
Renesas Micro Systems Co. Ltd.
Hiroshi FURUKAWA
Renesas Micro Systems Co. Ltd.
Yuta YAMATO
Fukuoka Industry Science Technology Foundation
Seiji KAJIHARA
Kyushu Institute of Technology
Keyword
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Kohei MIYASE, Ryota SAKAI, Xiaoqing WEN, Masao ASO, Hiroshi FURUKAWA, Yuta YAMATO, Seiji KAJIHARA, "A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing" in IEICE TRANSACTIONS on Information,
vol. E96-D, no. 9, pp. 2003-2011, September 2013, doi: 10.1587/transinf.E96.D.2003.
Abstract: Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E96.D.2003/_p
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@ARTICLE{e96-d_9_2003,
author={Kohei MIYASE, Ryota SAKAI, Xiaoqing WEN, Masao ASO, Hiroshi FURUKAWA, Yuta YAMATO, Seiji KAJIHARA, },
journal={IEICE TRANSACTIONS on Information},
title={A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing},
year={2013},
volume={E96-D},
number={9},
pages={2003-2011},
abstract={Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.},
keywords={},
doi={10.1587/transinf.E96.D.2003},
ISSN={1745-1361},
month={September},}
Copy
TY - JOUR
TI - A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
T2 - IEICE TRANSACTIONS on Information
SP - 2003
EP - 2011
AU - Kohei MIYASE
AU - Ryota SAKAI
AU - Xiaoqing WEN
AU - Masao ASO
AU - Hiroshi FURUKAWA
AU - Yuta YAMATO
AU - Seiji KAJIHARA
PY - 2013
DO - 10.1587/transinf.E96.D.2003
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E96-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 2013
AB - Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
ER -
English
